scholarly journals Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

2013 ◽  
Vol 4 ◽  
pp. 87-93 ◽  
Author(s):  
Jeffrey C Williams ◽  
Santiago D Solares
Keyword(s):  
Signal To Noise Ratio ◽  
Force Spectroscopy ◽  
Inversion Method ◽  
Simple Extension ◽  
Atomic Force Spectroscopy ◽  
Spectral Inversion ◽  
Rate Dependent ◽  
Atomic Force ◽  
Formidable Challenge ◽  
Surface Scan

We introduce a novel and potentially powerful, yet relatively simple extension of the spectral inversion method, which offers the possibility of carrying out 4-dimensional (4D) atomic force spectroscopy. With the extended spectral inversion method it is theoretically possible to measure the tip–sample forces as a function of the three Cartesian coordinates in the scanning volume (x, y and z) and the vertical velocity of the tip, through a single 2-dimensional (2D) surface scan. Although signal-to-noise ratio limitations can currently prevent the accurate experimental implementation of the 4D method, and the extraction of rate-dependent material properties from the force maps is a formidable challenge, the spectral inversion method is a promising approach due to its dynamic nature, robustness, relative simplicity and previous successes.

Dysfunction of endothelial cells exposed to nanomaterials assessed by atomic force spectroscopy

Micron ◽  
2021 ◽  
Vol 145 ◽  
pp. 103062
Author(s):  
Agnieszka Maria Kolodziejczyk ◽  
Paulina Sokolowska ◽  
Aleksandra Zimon ◽  
Magdalena Grala ◽  
Marcin Rosowski ◽  
...  
Keyword(s):  
Endothelial Cells ◽  
Force Spectroscopy ◽  
Atomic Force Spectroscopy ◽  
Atomic Force

scholarly journals Reducing uncertainties in energy dissipation measurements in atomic force spectroscopy of molecular networks and cell-adhesion studies

2018 ◽  
Vol 8 (1) ◽  
Author(s):  
Soma Biswas ◽  
Samuel Leitao ◽  
Quentin Theillaud ◽  
Blake W. Erickson ◽  
Georg E. Fantner
Keyword(s):  
Cell Adhesion ◽  
Energy Dissipation ◽  
Force Spectroscopy ◽  
Molecular Networks ◽  
Atomic Force Spectroscopy ◽  
Atomic Force

scholarly journals Concurrent atomic force spectroscopy

2019 ◽  
Vol 2 (1) ◽  
Author(s):  
Carolina Pimenta-Lopes ◽  
Carmen Suay-Corredera ◽  
Diana Velázquez-Carreras ◽  
David Sánchez-Ortiz ◽  
Jorge Alegre-Cebollada
Keyword(s):  
Force Spectroscopy ◽  
Atomic Force Spectroscopy ◽  
Atomic Force

Evaluation of Cell Membrane-Modulating Properties of Non-Ionic Surfactants with the use of Atomic Force Spectroscopy

2015 ◽  
Vol 5 (2) ◽  
pp. 91-96
Author(s):  
Oksana V. Bondar ◽  
Denis V. Lebedev ◽  
Vesta D. Shevchenko ◽  
Anastas A. Bukharaev ◽  
Yury N. Osin ◽  
...  
Keyword(s):  
Cell Membrane ◽  
Force Spectroscopy ◽  
Ionic Surfactants ◽  
Atomic Force Spectroscopy ◽  
Atomic Force

scholarly journals Atomic Force Spectroscopy on Ionic Liquids

2019 ◽  
Vol 9 (11) ◽  
pp. 2207 ◽  
Author(s):  
Christian Rodenbücher ◽  
Klaus Wippermann ◽  
Carsten Korte
Keyword(s):  
Ionic Liquid ◽  
Ionic Liquids ◽  
Electrical Potential ◽  
Force Spectroscopy ◽  
Interface Structure ◽  
Layer Model ◽  
Atomic Force Spectroscopy ◽  
Atomic Force ◽  
Double Layer Model ◽  
Electrified Interface

Ionic liquids have become of significant relevance in chemistry, as they can serve as environmentally-friendly solvents, electrolytes, and lubricants with bespoke properties. In particular for electrochemical applications, an understanding of the interface structure between the ionic liquid and an electrified interface is needed to model and optimize the reactions taking place on the solid surface. As with ionic liquids, the interplay between electrostatic forces and steric effects leads to an intrinsic heterogeneity, as the structure of the ionic liquid above an electrified interface cannot be described by the classical electrical double layer model. Instead, a layered solvation layer is present with a structure that depends on the material combination of the ionic liquid and substrate. In order to experimentally monitor this structure, atomic force spectroscopy (AFS) has become the method of choice. By measuring the force acting on a sharp microfabricated tip while approaching the surface in an ionic liquid, it has become possible to map the solvation layers with sub-nanometer resolution. In this review, we provide an overview of the AFS studies on ionic liquids published in recent years that illustrate how the interface is formed and how it can be modified by applying electrical potential or by adding impurities and solvents.

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