The Method of Product Conceptual Design Based on Low-carbon Constraint

2013 ◽  
Vol 49 (07) ◽  
pp. 58 ◽  
Author(s):  
Feng XU
Keyword(s):  
Conceptual Design ◽  
Low Carbon

A smart knowledge deployment method for the conceptual design of low-carbon products

2021 ◽  
Vol 321 ◽  
pp. 128994
Author(s):  
Xin Guo ◽  
Wu Zhao ◽  
Huicong Hu ◽  
Li Li ◽  
Ying Liu ◽  
...  
Keyword(s):  
Conceptual Design ◽  
Low Carbon

scholarly journals Low-carbon product conceptual design from the perspectives of technical system and human use

2020 ◽  
Vol 244 ◽  
pp. 118819 ◽  
Author(s):  
Xianfeng Ai ◽  
Zhigang Jiang ◽  
Hua Zhang ◽  
Yan Wang
Keyword(s):  
Conceptual Design ◽  
Technical System ◽  
Low Carbon ◽  
Carbon Product ◽  
Human Use

Low-carbon conceptual design based on product life cycle assessment

2015 ◽  
Vol 81 (5-8) ◽  
pp. 863-874 ◽  
Author(s):  
Bin He ◽  
Wen Tang ◽  
Jun Wang ◽  
Shan Huang ◽  
Zhongqiang Deng ◽  
...  
Keyword(s):  
Life Cycle Assessment ◽  
Life Cycle ◽  
Conceptual Design ◽  
Product Life Cycle ◽  
Low Carbon ◽  
Product Life

S.E.M.-T.E.M. Image Comparison

1971 ◽  
Vol 29 ◽  
pp. 132-133
Author(s):  
G. M. Greene ◽  
J. W. Sprys
Keyword(s):  
Electron Microscope ◽  
Low Carbon Steel ◽  
Secondary Emission ◽  
Low Carbon ◽  
Preparation Time ◽  
Actual Surface ◽  
Fine Detail ◽  
Transmission Electron ◽  
Transmission Study ◽  
Large Sections

The present study demonstrates that fracture surfaces appear strikingly different when observed in the transmission electron microscope by replication and in the scanning electron microscope by backscattering and secondary emission. It is important to know what form these differences take because of the limitations of each instrument. Replication is useful for study of surfaces too large for insertion into the S.E.M. and for resolution of fine detail at high magnification with the T.E.M. Scanning microscopy reduces sample preparation time and allows large sections of the actual surface to be viewed.In the present investigation various modes of the S.E.M. along with the transmission mode in the T.E.M. were used to study one area of a fatigue surface of a low carbon steel. Following transmission study of a platinum carbon replica in the T.E.M. and S.E.M. the replica was coated with a gold layer approximately 200A° in thickness to improve electron emission.

Lattice Imaging of Twin, Lath and α/Martensite Boundaries in Duplex Low Carbon Steels

1977 ◽  
Vol 35 ◽  
pp. 118-119
Author(s):  
J. Y. Koo ◽  
G. Thomas
Keyword(s):  
High Resolution Electron Microscopy ◽  
Ferrite Matrix ◽  
Carbon Steels ◽  
Bright Field Image ◽  
Low Carbon ◽  
Lattice Imaging ◽  
Bright Field ◽  
Lattice Image ◽  
New Information ◽  
Resolution Electron

High resolution electron microscopy has been shown to give new information on defects(1) and phase transformations in solids (2,3). In a continuing program of lattice fringe imaging of alloys, we have applied this technique to the martensitic transformation in steels in order to characterize the atomic environments near twin, lath and αmartensite boundaries. This paper describes current progress in this program.Figures A and B show lattice image and conventional bright field image of the same area of a duplex Fe/2Si/0.1C steel described elsewhere(4). The microstructure consists of internally twinned martensite (M) embedded in a ferrite matrix (F). Use of the 2-beam tilted illumination technique incorporating a twin reflection produced {110} fringes across the microtwins.

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