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2021 ◽  
Vol 7 (3) ◽  
pp. 38
Author(s):  
Roshni Yadav ◽  
Chun-Hsien Wu ◽  
I-Fen Huang ◽  
Xu Li ◽  
Te-Ho Wu ◽  
...  

In this study, [Co/Ni]2/PtMn thin films with different PtMn thicknesses (2.7 to 32.4 nm) were prepared on Si/SiO2 substrates. The post-deposition perpendicular magnetic field annealing (MFA) processes were carried out to modify the structures and magnetic properties. The MFA process also induced strong interlayer diffusion, rendering a less sharp interface between Co and Ni and PtMn layers. The transmission electron microscopy (TEM) lattice image analysis has shown that the films consisted of face-centered tetragonal (fct) PtMn (ordered by MFA), body-centered cubic (bcc) NiMn (due to intermixing), in addition to face-centered cubic (fcc) Co, Ni, and PtMn phases. The peak shift (2-theta from 39.9° to 40.3°) in X-ray diffraction spectra also confirmed the structural transition from fcc PtMn to fct PtMn after MFA, in agreement with those obtained by lattice images in TEM. The interdiffusion induced by MFA was also evidenced by the depth profile of X-ray photoelectron spectroscopy (XPS). Further, the magnetic properties measured by vibrating sample magnetometry (VSM) have shown an increased coercivity in MFA-treated samples. This is attributed to the presence of ordered fct PtMn, and NiMn phases exchange coupled to the ferromagnetic [Co/Ni]2 layers. The vertical shift (Mshift = −0.03 memu) of the hysteresis loops is ascribed to the pinned spins resulting from perpendicular MFA processes.


2020 ◽  
Vol 5 (1) ◽  
pp. 13-17
Author(s):  
György Zoltán Radnóczi ◽  
Zoltán Herceg ◽  
Tamás Rafael Kiss

AbstractVery accurate measurement of distances in the order of several µm is demonstrated on a single crystal Si sample by counting the lattice fringes on stitched high resolution TEM/STEM images. Stitching of TEM images commonly relies on correspondence points found in the image, however, the nearly perfect periodic nature of a lattice image renders such a procedure very unreliable. To overcome this difficulty artificial correspondence points are created on the sample using the electron beam. An accuracy better than 1% can be reached while measuring distances in the order of 1 µm. A detailed description of the process is provided, and its usability for accurately measuring large distances is discussed in detail.


MRS Advances ◽  
2020 ◽  
Vol 5 (27-28) ◽  
pp. 1415-1421
Author(s):  
Xiangyun Song ◽  
Yanbao Fu ◽  
Chengyu Song ◽  
Philip Ross ◽  
Vince Battaglia

AbstractHerein we describe a technique for preparing samples from cycled Li-ion batteries with minimal contact with atmospheric water for examination by TEM and to provide the results of an analysis of the SEI in Li-ion cells. The electrode samples were prepared in a glove box by manipulation with a diamond tipped pen to carefully dislodge particles directly onto the TEM sample holder. Electrodes were extracted from Li-ion cells that contained a cathode of high capacity, manganese rich NCM (HCMR-NCM). Nanometer-sized MnF2 crystal particles embed themselves in the SEI layer of the anodes as observed and confirmed by HRTEM lattice image analysis and EELS. Cross-sections of the SEI layer reveal that the thickness of the SEI and propensity for MnF2 crystal deposition is non-uniform.


2019 ◽  
Vol 4 (1) ◽  
pp. 151-162 ◽  
Author(s):  
Berhanu Assaye ◽  
Mihret Alamneh ◽  
Lakshmi Narayan Mishra ◽  
Yeshiwas Mebrat

AbstractIn this paper, we introduce the concept of dual skew Heyting almost distributive lattices (dual skew HADLs) and characterise it in terms of dual HADL. We define an equivalence relation θ on a dual skew HADL L and prove that θ is a congruence relation on the equivalence class [x]θ so that each congruence class is a maximal rectangular subalgebra and the quotient [y]θ/θ is a maximal lattice image of [x]θ for any y ∈ [x]θ. Moreover, we show that if the set PI (L) of all the principal ideals of an ADL L with 0 is a dual skew Heyting algebra then L becomes a dual skew HADL. Further we present different conditions on which an ADL with 0 becomes a dual skew HADL.


2018 ◽  
Vol 36 (1) ◽  
pp. 21-26 ◽  
Author(s):  
Maria Arshad ◽  
Abbas Khan ◽  
Zahoor H. Farooqi ◽  
Muhammad Usman ◽  
M. Abdul Waseem ◽  
...  

Abstract Due to their potential application in various fields of science and technology, the eco-friendly bio-synthesis of silver (Ag) nanoparticles (NPs) is a growing area for researchers. In this study, we report the green synthesis of Ag nanoparticles and their characterization by using various techniques. For the preparation of Ag particles, aqueous plant extract of ailanthus altissima was used as a reducing medium for Ag+ ions of silver nitrate to Ag0. UV-Vis spectrophotometry was used to trace the formation of Ag particles by noting their surface plasmon resonance peaks (400 nm to 440 nm). Fourier transform infrared spectroscopy (FT-IR) was employed to reveal the chemical composition of Ag nanoparticles which were capped by plant extract. Scanning electron microscopy (SEM) was used to get the lattice image, morphology and average size of Ag particles. The average size distribution of Ag NPs dispersed in aqueous media was also measured using dynamic light scattering (DLS). It was found that DLS results are in good agreement with those obtained from SEM. The synthesized particles were then subjected to the antibacterial and antifungal activities by studying them against various species, such as bacillus cereus, staphylococcus aureus, pseudomonas aeruginosa, E. coli and A. parasiticus, A. niger and A. flavus fungi. It was noted from the growth curves of both bacteria and fungi that in the presence of silver nanoparticles they show more in-zone growth as compared to the plant extract.


Scanning ◽  
2017 ◽  
Vol 2017 ◽  
pp. 1-8 ◽  
Author(s):  
Hao Zhang ◽  
Xianqi Li ◽  
Yunmei Chen ◽  
Jewook Park ◽  
An-Ping Li ◽  
...  

We present an image postprocessing framework for Scanning Tunneling Microscope (STM) to reduce the strong spurious oscillations and scan line noise at fast scan rates and preserve the features, allowing an order of magnitude increase in the scan rate without upgrading the hardware. The proposed method consists of two steps for large scale images and four steps for atomic scale images. For large scale images, we first apply for each line an image registration method to align the forward and backward scans of the same line. In the second step we apply a “rubber band” model which is solved by a novel Constrained Adaptive and Iterative Filtering Algorithm (CIAFA). The numerical results on measurement from copper(111) surface indicate the processed images are comparable in accuracy to data obtained with a slow scan rate, but are free of the scan drift error commonly seen in slow scan data. For atomic scale images, an additional first step to remove line-by-line strong background fluctuations and a fourth step of replacing the postprocessed image by its ranking map as the final atomic resolution image are required. The resulting image restores the lattice image that is nearly undetectable in the original fast scan data.


Author(s):  
Dipak Kumar ◽  
KN Pandey ◽  
Dipak Kumar Das

Characterization of yttria-stabilized zirconia coatings deposited on AA2024-T351 aluminum alloy by air plasma spraying is carried out in the present work to assess its applicability as a thermal barrier coating on automotive components aluminum alloys. Tetragonality of coating microstructures was confirmed through X-ray diffractometer, transmission electron microscopy, and high-resolution transmission electron microscopy. Lattice-image spacing obtained from high-resolution transmission electron microscopy confirmed multilayer structure of the coating and that the tetragonal phases are stable. From the optical microscopy it was found that there are good coating particle distribution and homogeneity of coating particles on the substrate while atomic force microscopy provided information about surface bumps and pits. Small roughness of the coating microstructure was found to be very low. Small roughness showed good deposition efficiency of the coating structures.


2013 ◽  
Vol 19 (S2) ◽  
pp. 1590-1591
Author(s):  
P. Fraundorf ◽  
S. Mukherjee

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


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