Conventional Microscope-Integrated Intraoperative OCT Versus Digitally Enabled Intraoperative OCT in Vitreoretinal Surgery in the DISCOVER Study

2020 ◽  
Vol 51 (4) ◽  
pp. S37-S43 ◽  
Author(s):  
Natalia Figueiredo ◽  
Katherine E. Talcott ◽  
Sunil K. Srivastava ◽  
Ming Hu ◽  
Aleksandra Rachitskaya ◽  
...  
2018 ◽  
Vol 2 (10) ◽  
pp. 1041-1049 ◽  
Author(s):  
Jaya B. Kumar ◽  
Justis P. Ehlers ◽  
Sumit Sharma ◽  
Sunil K. Srivastava

Author(s):  
A. V. Crewe

We have become accustomed to differentiating between the scanning microscope and the conventional transmission microscope according to the resolving power which the two instruments offer. The conventional microscope is capable of a point resolution of a few angstroms and line resolutions of periodic objects of about 1Å. On the other hand, the scanning microscope, in its normal form, is not ordinarily capable of a point resolution better than 100Å. Upon examining reasons for the 100Å limitation, it becomes clear that this is based more on tradition than reason, and in particular, it is a condition imposed upon the microscope by adherence to thermal sources of electrons.


Author(s):  
A. V. Crewe

If the resolving power of a scanning electron microscope can be improved until it is comparable to that of a conventional microscope, it would serve as a valuable additional tool in many investigations.The salient feature of scanning microscopes is that the image-forming process takes place before the electrons strike the specimen. This means that several different detection systems can be employed in order to present information about the specimen. In our own particular work we have concentrated on the use of energy loss information in the beam which is transmitted through the specimen, but there are also numerous other possibilities (such as secondary emission, generation of X-rays, and cathode luminescence).Another difference between the pictures one would obtain from the scanning microscope and those obtained from a conventional microscope is that the diffraction phenomena are totally different. The only diffraction phenomena which would be seen in the scanning microscope are those which exist in the beam itself, and not those produced by the specimen.


2020 ◽  
Vol Volume 14 ◽  
pp. 2307-2309
Author(s):  
Fares Antaki ◽  
Daniel Milad ◽  
Simon Javidi ◽  
Ali Dirani

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