Stochastic series expansion QMC-I

SciVee ◽  
2010 ◽  
Keyword(s):  
Series Expansion ◽  
Stochastic Series

scholarly journals Stochastic series expansion algorithm for theS=1∕2XYmodel with four-site ring exchange

2005 ◽  
Vol 72 (2) ◽  
Author(s):  
Roger G. Melko ◽  
Anders W. Sandvik
Keyword(s):  
Series Expansion ◽  
Ring Exchange ◽  
Stochastic Series

scholarly journals Stochastic series expansion simulation of thet−Vmodel

2016 ◽  
Vol 93 (15) ◽  
Author(s):  
Lei Wang ◽  
Ye-Hua Liu ◽  
Matthias Troyer
Keyword(s):  
Series Expansion ◽  
Stochastic Series

scholarly journals Stochastic series expansion method with operator-loop update

1999 ◽  
Vol 59 (22) ◽  
pp. R14157-R14160 ◽  
Author(s):  
Anders W. Sandvik
Keyword(s):  
Series Expansion ◽  
Expansion Method ◽  
Stochastic Series ◽  
Series Expansion Method

scholarly journals Accessing the dynamics of large many-particle systems using the stochastic series expansion

2001 ◽  
Vol 64 (6) ◽  
Author(s):  
Ansgar Dorneich ◽  
Matthias Troyer
Keyword(s):  
Series Expansion ◽  
Particle Systems ◽  
Stochastic Series

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

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