Fabric Defect Classification Based on Local Region Features and SVM

2012 ◽  
Vol 182-183 ◽  
pp. 634-638
Author(s):  
Yi Hong Li ◽  
Zhao Yang Lu ◽  
Jing Li ◽  
Ling Ling Cui

The big differences of the texture and shapes in the same type and certain similarities among heterogeneous types result in the difficult classification of fabric defects. Compared with traditional global statistical method, we put up a new solution, which makes use of the fabric defect local region features to keep the defect property and defect classification by Support Vector Machines (SVM). Based on small-samples learning machine of SVM, we obtain a good performance of less computational load and high recognition rate.

Author(s):  
Marianne Maktabi ◽  
Hannes Köhler ◽  
Magarita Ivanova ◽  
Thomas Neumuth ◽  
Nada Rayes ◽  
...  

Author(s):  
Hedieh Sajedi ◽  
Mehran Bahador

In this paper, a new approach for segmentation and recognition of Persian handwritten numbers is presented. This method utilizes the framing feature technique in combination with outer profile feature that we named this the adapted framing feature. In our proposed approach, segmentation of the numbers into digits has been carried out automatically. In the classification stage of the proposed method, Support Vector Machines (SVM) and k-Nearest Neighbors (k-NN) are used. Experimentations are conducted on the IFHCDB database consisting 17,740 numeral images and HODA database consisting 102,352 numeral images. In isolated digit level on IFHCDB, the recognition rate of 99.27%, is achieved by using SVM with polynomial kernel. Furthermore, in isolated digit level on HODA, the recognition rate of 99.07% is achieved by using SVM with polynomial kernel. The experiments illustrate that applying our proposed method resulted higher accuracy compared to previous researches.


2011 ◽  
Vol 61 (9) ◽  
pp. 2874-2878 ◽  
Author(s):  
L. Gonzalez-Abril ◽  
F. Velasco ◽  
J.A. Ortega ◽  
L. Franco

2004 ◽  
Vol 44 (2) ◽  
pp. 499-507 ◽  
Author(s):  
Omowunmi Sadik ◽  
Walker H. Land, ◽  
Adam K. Wanekaya ◽  
Michiko Uematsu ◽  
Mark J. Embrechts ◽  
...  

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