Measurement of Stokes Parameters by Quarter-Wave Plate and Polarizer

2006 ◽  
Vol 3-4 ◽  
pp. 235-242 ◽  
Author(s):  
T. Kihara
Keyword(s):  
Wavelength Range ◽  
Relative Phase ◽  
Monochromatic Light ◽  
Polarized Light ◽  
Stokes Parameters ◽  
Quarter Wave Plate ◽  
Phase Retardation ◽  
Wave Plate ◽  
Wide Wavelength Range ◽  
Quarter Wave

Formulations of the theory of automated photoelasticity are expressed simply by use of the Stokes parameters. In the automated photoelasticity, the measurement of the total relative phase retardation must often be performed over a wide wavelength range. The Stokes parameters (S0, S1, S2 and S3) need to be measured over a wide wavelength range. The Stokes parameters of monochromatic light can be measured by the adjustable azimuth settings of a retarder and analyzer (ARA) method. When undertaking the measurement of the Stokes parameters of light of an arbitrary wavelength over a wide wavelength range, the measurement of S3 by the conventional ARA method is dependent on the phase difference error ρ i of a quarter-wave plate mismatch as well as Stokes parameter S2. The measurement of S3 by a judicious choice of azimuth settings of a quarter-wave plate and a polarizer (JCAQP) as in the method proposed can be obtained by considering ρ I . The JCAQP method is clarified by employing the Poincaré sphere. It is shown that application of the JCAQP method yields the principal axis and the relative phase retardation of the birefringent plate free from the ρ i of the quarter-wave plate for incident elliptically polarized light of an arbitrary wavelength.

Quarter-wave plate tunable in a wide wavelength range

1995 ◽  
Vol 25 (2) ◽  
pp. 187-190 ◽  
Author(s):  
I V Gol'tser ◽  
M Ya Darsht ◽  
Boris Ya Zel'dovich ◽  
N D Kundikova ◽  
L F Rogacheva
Keyword(s):  
Wavelength Range ◽  
Quarter Wave Plate ◽  
Wave Plate ◽  
Wide Wavelength Range ◽  
Quarter Wave

Liquid Crystal Variable Retarders’ Phase Retardation Measurement with Quarter-Wave Plate and the Validation

2011 ◽  
Vol 181-182 ◽  
pp. 297-300
Author(s):  
Lin Ling Bai ◽  
Dai Li ◽  
Zi Qiang Huang
Keyword(s):  
Liquid Crystal ◽  
Polarized Light ◽  
Optical Systems ◽  
Quarter Wave Plate ◽  
Phase Retardation ◽  
Measurement Systems ◽  
Wave Plate ◽  
Relative Value ◽  
Optical Retardation ◽  
Quarter Wave

Liquid crystal variable retarders (LCVRs) are starting to be widely used in optical systems because of their capacity to provide a controlled variable optical retardation – an important technical parameter for LCVRs. In this paper, using polarization condition change of polarized light, a set of measurement systems is built. Through the measurement of the relative value of luminous intensity instead of the absolute value which can be easy affected by ambient light and the illuminant instability, it can comparative accurately acquire electrically controlled phase retardation of LCVRs. With the light source of He-Ne laser with the wave 632.8 nm, at temperature 25 °C, a standard quarter-wave plate has been measured, with the relative error less than 1 %.

Optical heterodyne measurement of the phase retardation of a quarter-wave plate

1988 ◽  
Vol 13 (7) ◽  
pp. 553 ◽  
Author(s):  
Lin Yao ◽  
Zhou Zhiyao ◽  
Wang Runwen
Keyword(s):  
Quarter Wave Plate ◽  
Optical Heterodyne ◽  
Phase Retardation ◽  
Wave Plate ◽  
Quarter Wave

Wavelength dependence of the phase retardation of a quarter-wave plate

1995 ◽  
Vol 60 (4) ◽  
pp. 405-407 ◽  
Author(s):  
S. De Nicola ◽  
P. Ferraro ◽  
A. Finizio ◽  
G. Pierattini
Keyword(s):  
Wavelength Dependence ◽  
Quarter Wave Plate ◽  
Phase Retardation ◽  
Wave Plate ◽  
Quarter Wave

Development of Polarization Modulation Near-Field Scanning Optical Microscope and its Application to Mapping Defect-Induced Birefringence in SrTiO3 Bicrystals

1998 ◽  
Vol 4 (S2) ◽  
pp. 314-315
Author(s):  
Julia W. P. Hsu ◽  
E. B. McDaniel ◽  
S. C. McClain
Keyword(s):  
Modulation Frequency ◽  
Near Field ◽  
Polarized Light ◽  
Optical Microscope ◽  
Quarter Wave Plate ◽  
Polarization Modulation ◽  
Polarization Component ◽  
Wave Plate ◽  
Submicron Scale ◽  
Quarter Wave

Photoelastic measurement is a sensitive optical technique to map strain fields in otherwise isotropic materials. To extend this method to the submicron scale, we combine dynamic polarimetry with nearfield scanning optical microscopy (NSOM) and construct a polarization modulation NSOM (PMNSOM). The 670 nm laser light passes first through a linear polarizer (oriented at 90°), and then through a photoelastic modulator (PEM), and finally through a quarter wave plate. The PEM introduces a sinusoidally time varying phase shift δ0sin(2πft) into the +45° polarization component, where the modulation frequency/is the resonant frequency (50 kHz) of the PEM quartz element. The quarter wave plate (oriented at 0°) transforms this elliptically polarized light into linearly polarized light with its orientation varying sinusoidally at the modulation frequency. This polarized light is then coupled into a single-mode optical fiber leading to the NSOM tip.

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