Microbial Leaching of Metals from Printed Circuit Boards

2007 ◽  
Vol 20-21 ◽  
pp. 99-102 ◽  
Author(s):  
Sabine Willscher ◽  
M. Katzschner ◽  
K. Jentzsch ◽  
S. Matys ◽  
Herbert Pöllmann

Electrical and electronic equipment (EEE), e.g. printed circuit boards, contain substantial amounts of metals, e.g. Cu, Pb and Sn. The objective of this work was to investigate the bioleaching of a material, originating from a technical waste processing facility, as one possible way of a complete separation of the metals from the polymer carrier. During the leaching experiments the mechanism of the leaching process was investigated, and biofilms and precipitates were analyzed by microscopical (SEM) and spectroscopical methods (EDX, XRF, XRD). The enhanced formation of exopolymer layers seems to promote the precipitation of secondary mineral particles beneath and the sorption of particles from the suspension on the layer surface.

Author(s):  
Sabine Willscher ◽  
M. Katzschner ◽  
K. Jentzsch ◽  
S. Matys ◽  
Herbert Pöllmann

2018 ◽  
Vol 28 (6) ◽  
pp. 333-339 ◽  
Author(s):  
Bhumika R. Khatri ◽  
Asha B. Sodha ◽  
Monal B. Shah ◽  
Devayani R. Tipre ◽  
Shailesh R. Dave

2008 ◽  
Vol 128 (11) ◽  
pp. 657-662 ◽  
Author(s):  
Tsuyoshi Maeno ◽  
Yukihiko Sakurai ◽  
Takanori Unou ◽  
Kouji Ichikawa ◽  
Osamu Fujiwara

2018 ◽  
Vol 23 (2) ◽  
pp. 141-148
Author(s):  
S.Sh. Rekhviashvili ◽  
◽  
M.O. Mamchuev ◽  
V.V. Narozhnov ◽  
M.M. Oshkhunov ◽  
...  

2013 ◽  
Vol 61 (3) ◽  
pp. 731-735
Author(s):  
A.W. Stadler ◽  
Z. Zawiślak ◽  
W. Stęplewski ◽  
A. Dziedzic

Abstract. Noise studies of planar thin-film Ni-P resistors made in/on Printed Circuit Boards, both covered with two different types of cladding or uncladded have been described. The resistors have been made of the resistive-conductive-material (Ohmega-Ply©) of 100 Ώ/sq. Noise of the selected pairs of samples has been measured in the DC resistance bridge with a transformer as the first stage in a signal path. 1/f noise caused by resistance fluctuations has been found to be the main noise component. Parameters describing noise properties of the resistors have been calculated and then compared with the parameters of other previously studied thin- and thick-film resistive materials.


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