Calculation of D-Section Classical V-Belt Power Rating in Different Reliability

2011 ◽  
Vol 338 ◽  
pp. 446-449 ◽  
Author(s):  
Chuan Qiong Sun ◽  
Ai Hua Ren ◽  
Guo Xing Sun ◽  
Yong De Liu

The deficiencies of the Classical V-belt power rating calculation method in GB / T 11355 and GB / T 13575 is pointed. A new formula modifying the power rating with reliability factor is introduced. The data resulting from the step stress accelerated life testing of D-section Classical V-belt is transformed into equivalent limit stress data which is normal distribution, and then the limit stress of D-section Classical V-belt in different reliability and the corresponding reliability factor are determined, a calculating example by the new method is provided.

2018 ◽  
Vol 35 (8) ◽  
pp. 1671-1682 ◽  
Author(s):  
Cherry Bhargava ◽  
Vijay Kumar Banga ◽  
Yaduvir Singh

Purpose An electrolytic capacitor is extensively used as filtering devices in various power supplies and audio amplifiers. Low cost and higher value of capacitance make it more well known. As environmental stress and electrical parameters increase, capacitors degrade on accelerated pace. The paper aims to discuss these issues. Design/methodology/approach This paper focusses on the impact of thermal stress on electrolytic capacitors using accelerated life testing technique. The failure time was calculated based on the change in capacitance, equivalent series resistance and weight loss. The experimental results are compared with the outcome of already available life monitoring methods, and the accuracy level of these methods is accessed. Findings The results of all the three methods are having maximum 55 per cent accuracy. To enhance the accuracy level of theoretical methods, modifications have been suggested. A new method has been proposed, whose outcome is 92 per cent accurate with respect to experimentally obtained outcomes. Practical implications To assess the capacitor’s reliability using an experimental and modified theoretical method, failure prediction can be done before it actually fails. Originality/value A new method has been proposed to access the lifetime of capacitor.


Author(s):  
Vanderley Vasconcelos ◽  
WELLINGTON SOARES ◽  
Antonio Carlos Lopes da Costa ◽  
Raíssa Oliveira Marques

Author(s):  
Abd El-Maseh, M. P

<p>In this paper, the Bayesian estimation for the unknown parameters for the bivariate generalized exponential (BVGE) distribution under Bivariate censoring type-I samples with constant stress accelerated life testing (CSALT) are discussed. The scale parameter of the lifetime distribution at constant stress levels is assumed to be an inverse power law function of the stress level. The parameters are estimated by Bayesian approach using Markov Chain Monte Carlo (MCMC) method based on Gibbs sampling. Then, the numerical studies are introduced to illustrate the approach study using samples which have been generated from the BVGE distribution.</p>


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