Author(s):  
N. Thirupathi Rao ◽  
Debnath Bhattacharyya ◽  
S. Naga Mallik Raj

2011 ◽  
Vol 131 (7) ◽  
pp. 424-428
Author(s):  
Masahide YANAGI ◽  
Yosuke UDAGAWA ◽  
Shisei WARAGAI
Keyword(s):  

2012 ◽  
Vol E95.B (6) ◽  
pp. 1990-1996
Author(s):  
Seiya ABE ◽  
Sihun YANG ◽  
Masahito SHOYAMA ◽  
Tamotsu NINOMIYA ◽  
Akira MATSUMOTO ◽  
...  

Author(s):  
Chris Muller ◽  
Chuck Arent ◽  
Henry Yu

Abstract Lead-free manufacturing regulations, reduction in circuit board feature sizes and the miniaturization of components to improve hardware performance have combined to make data center IT equipment more prone to attack by corrosive contaminants. Manufacturers are under pressure to control contamination in the data center environment and maintaining acceptable limits is now critical to the continued reliable operation of datacom and IT equipment. This paper will discuss ongoing reliability issues with electronic equipment in data centers and will present updates on ongoing contamination concerns, standards activities, and case studies from several different locations illustrating the successful application of contamination assessment, control, and monitoring programs to eliminate electronic equipment failures.


2017 ◽  
Vol 26 (1) ◽  
pp. 113-128
Author(s):  
Gamal Eldin I. Selim ◽  
Mohamed A. El-Rashidy ◽  
Nawal A. El-Fishawy

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