Electrical Characterization of Thin-Film Transistors Based on Solution-Processed Metal Oxides
Keyword(s):
2018 ◽
Vol 215
(21)
◽
pp. 1800085
◽
2017 ◽
Vol 64
(8)
◽
pp. 3183-3188
◽
2004 ◽
Vol 146
(3)
◽
pp. 355-358
◽
2015 ◽
Vol 11
(2)
◽
pp. 149-151
◽
2008 ◽
Vol 205
(12)
◽
pp. 2958-2965
◽