Scanning near-field optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever
2014 ◽
Vol 53
(12)
◽
pp. 125201
◽
2016 ◽
Vol 55
(8S1)
◽
pp. 08NB04
◽
Keyword(s):
2002 ◽
Vol 205
(2)
◽
pp. 136-146
◽
2002 ◽
Vol 73
(8)
◽
pp. 2942-2947
◽
Keyword(s):
2000 ◽
Vol 104
(51)
◽
pp. 12098-12101
◽
1999 ◽
Vol 146
(5)
◽
pp. 239-243
◽
Keyword(s):
Keyword(s):
2003 ◽
Vol 32
(7)
◽
pp. 620-627
◽
Keyword(s):
2002 ◽
Vol 73
(4)
◽
pp. 1795-1802
◽