truncated life test
Recently Published Documents


TOTAL DOCUMENTS

48
(FIVE YEARS 26)

H-INDEX

5
(FIVE YEARS 1)

2022 ◽  
Vol 19 (1) ◽  
Author(s):  
Jaffer Hussain ◽  
S Balamurali ◽  
Muhammad Aslam

The design of a Skip-lot sampling plan of type SkSP-R is presented for time truncated life test for the Weibull, Exponentiated Weibull, and Birnbaum-Saunders lifetime distributions. The plan parameters of the SkSP-R plan under these three distributions are determined through a nonlinear optimization problem. Tables are also constructed for each distribution. The advantages of the proposed plan over the existing sampling schemes are discussed. Application of the proposed plan is explained with the help of an example. The Birnbaum-Saunders distribution is economically superior to other two distributions in terms of minimum average sample number.


Author(s):  
Abhimanyu Singh Yadav ◽  
Mahendra Saha ◽  
Shivanshi Shukla ◽  
Harsh Tripathi ◽  
Rajashree Dey

In this article, a reliability test plan is developed for Logistic-exponential distribution (LoED) under time truncated life test scheme. The distribution has been chosen because it can used to model lifetime of several reliability phenomenon and it performs better than many well known existing distributions. With the discussions of statistical properties of the aforesaid model, the reliability test plan has been established under the assumption of median quality characteristics when minimum confidence level P* is given. To quench the objective of the paper i.e; to serve as a guiding aid to the emerging practitioners, minimum sample sizes have been obtained by using binomial approximation and Poisson approximation for the proposed plan. Further, operating characteristic (OC) values for the various choices of quality level are placed. Also, minimum ratio of true median life to specified life has been presented for specified producer’s risk. Important findings of the proposed reliability test plan are given for considered value of k=0.75,1,2. To demonstrate the appropriateness of suggested reliability test plan is achieved using four real life situation.


Complexity ◽  
2021 ◽  
Vol 2021 ◽  
pp. 1-10
Author(s):  
Srinivasa Rao Gadde ◽  
Arnold K. Fulment ◽  
Josephat K. Peter

The proposed sampling plan in this article is referred to as multiple dependent state (MDS) sampling plans, for rejecting a lot based on properties of the current and preceding lot sampled. The median life of the product for the proposed sampling plan is assured based on a time-truncated life test, when a lifetime of the product follows exponentiated Weibull distribution (EWD). For the proposed plan, optimal parameters such as the number of preceding lots required for deciding whether to accept or reject the current lot, sample size, and rejection and acceptance numbers are obtained by the approach of two points on the operating characteristic curve (OC curve). Tables are constructed for various combinations of consumer and producer’s risks for various shape parameters. The proposed MDS sampling plan for EWD is demonstrated using the coronavirus (COVID-19) outbreak in China. The performance of the proposed sampling plan is compared with the existing single-sampling plan (SSP) when the quality of the product follows EWD.


Author(s):  
A. B. Zoramawa ◽  
S. U. Gulumbe

This paper proposed a sequential probability sampling plan for a truncated life test using a Rayleigh distribution from  a designed double sampling plans where the interest was to obtain the minimum sample size necessary to assure that the average life time of a product is longer than the default life time at the specified consumer’s and producer’s confidence level. Estimations of minimum sample, acceptance and rejection numbers obtained are analyzed and presented to explain the usefulness of sequential plans in relation to single and double sampling plan. Probability of acceptance (Pa), Average sample number (ASN) and Average outgoing quality (AOQ) for the plans are computed. The three regions; acceptance, continue sampling and rejection were determined. The five points necessary to plot ASN curve were also computed and presented.


Sign in / Sign up

Export Citation Format

Share Document