ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
digital circuit testing
Recently Published Documents
TOTAL DOCUMENTS
9
(FIVE YEARS 2)
H-INDEX
3
(FIVE YEARS 1)
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Digital Circuit Testing Methods: An Analysis of Modern Problems
2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus)
◽
10.1109/elconrus51938.2021.9396341
◽
2021
◽
Author(s):
Artyom A. Shvachko
◽
Timur N. Prokopenko
◽
Elena S. Yanakova
◽
Vyacheslav K. Kozlov
Keyword(s):
Digital Circuit
◽
Testing Methods
◽
Circuit Testing
◽
Digital Circuit Testing
Download Full-text
A survey of digital circuit testing in the light of machine learning
Wiley Interdisciplinary Reviews Data Mining and Knowledge Discovery
◽
10.1002/widm.1360
◽
2020
◽
Vol 11
(1)
◽
Cited By ~ 1
Author(s):
Manjari Pradhan
◽
Bhargab B. Bhattacharya
Keyword(s):
Machine Learning
◽
Digital Circuit
◽
Circuit Testing
◽
Digital Circuit Testing
Download Full-text
A Reconfigurable Processing Unit for Digital Circuit Testing using Built-In Self-Test Techniques
2006 IEEE Instrumentation and Measurement Technology Conference Proceedings
◽
10.1109/imtc.2006.236234
◽
2006
◽
Author(s):
Mohammed Elbadri
Keyword(s):
Digital Circuit
◽
Processing Unit
◽
Circuit Testing
◽
Reconfigurable Processing
◽
Digital Circuit Testing
◽
Self Test
◽
Built In Self Test
Download Full-text
A Reconfigurable Processing Unit for Digital Circuit Testing using Built-In Self-Test Techniques
2006 IEEE Instrumentation and Measurement Technology Conference Proceedings
◽
10.1109/imtc.2006.328406
◽
2006
◽
Cited By ~ 4
Author(s):
Mohammed Elbadri
◽
Voicu Groza
◽
Rami Abielmona
◽
Mansour Assaf
Keyword(s):
Digital Circuit
◽
Processing Unit
◽
Circuit Testing
◽
Reconfigurable Processing
◽
Digital Circuit Testing
◽
Self Test
◽
Built In Self Test
Download Full-text
Automated AC (timing) characterization for digital circuit testing
Proceedings Eleventh International Conference on VLSI Design
◽
10.1109/icvd.1998.646636
◽
2002
◽
Cited By ~ 6
Author(s):
S. Balajee
◽
A.K. Majhi
Keyword(s):
Digital Circuit
◽
Circuit Testing
◽
Digital Circuit Testing
Download Full-text
A picosecond-response photoconductive-sampling probe for digital circuit testing
Conference Proceedings. LEOS '97. 10th Annual Meeting IEEE Lasers and Electro-Optics Society 1997 Annual Meeting
◽
10.1109/leos.1997.645385
◽
2002
◽
Cited By ~ 3
Author(s):
G. David
◽
J.F. Whitaker
◽
E.J. Ledbetter
◽
T.R. Weatherford
◽
D. Fouts
◽
...
Keyword(s):
Digital Circuit
◽
Circuit Testing
◽
Sampling Probe
◽
Digital Circuit Testing
◽
Photoconductive Sampling
Download Full-text
Digital Circuit Testing on a Network of Workstations
1994 International Conference on Parallel Processing Vol. 3
◽
10.1109/icpp.1994.89
◽
1994
◽
Author(s):
S. Srinivasan
◽
J.H. Aylor
Keyword(s):
Digital Circuit
◽
Circuit Testing
◽
Network Of Workstations
◽
Digital Circuit Testing
Download Full-text
Digital circuit testing and design for testability
Design of Logic Systems
◽
10.1007/978-1-4899-6856-2_10
◽
1992
◽
pp. 403-455
Author(s):
D. Lewin
◽
D. Protheroe
Keyword(s):
Digital Circuit
◽
Design For Testability
◽
Circuit Testing
◽
Digital Circuit Testing
Download Full-text
Digital Circuit Testing
10.1016/c2009-0-21581-9
◽
1991
◽
Keyword(s):
Digital Circuit
◽
Circuit Testing
◽
Digital Circuit Testing
Download Full-text
Load More ...
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close