A Reconfigurable Processing Unit for Digital Circuit Testing using Built-In Self-Test Techniques

2006 IEEE Instrumentation and Measurement Technology Conference Proceedings ◽

10.1109/imtc.2006.328406 ◽

2006 ◽

Author(s):

Mohammed Elbadri ◽

Voicu Groza ◽

Rami Abielmona ◽

Mansour Assaf

Keyword(s):

Digital Circuit ◽

Processing Unit ◽

Circuit Testing ◽

Reconfigurable Processing ◽

Digital Circuit Testing ◽

Self Test ◽

Built In Self Test

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A Reconfigurable Processing Unit for Digital Circuit Testing using Built-In Self-Test Techniques

2006 IEEE Instrumentation and Measurement Technology Conference Proceedings ◽

10.1109/imtc.2006.236234 ◽

2006 ◽

Author(s):

Mohammed Elbadri

Keyword(s):

Digital Circuit ◽

Processing Unit ◽

Circuit Testing ◽

Reconfigurable Processing ◽

Digital Circuit Testing ◽

Self Test ◽

Built In Self Test

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Automated AC (timing) characterization for digital circuit testing

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646636 ◽

2002 ◽

Author(s):

S. Balajee ◽

A.K. Majhi

Keyword(s):

Digital Circuit ◽

Circuit Testing ◽

Digital Circuit Testing

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A survey of digital circuit testing in the light of machine learning

Wiley Interdisciplinary Reviews Data Mining and Knowledge Discovery ◽

10.1002/widm.1360 ◽

2020 ◽

Vol 11 (1) ◽

Author(s):

Manjari Pradhan ◽

Bhargab B. Bhattacharya

Keyword(s):

Machine Learning ◽

Digital Circuit ◽

Circuit Testing ◽

Digital Circuit Testing

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A picosecond-response photoconductive-sampling probe for digital circuit testing

Conference Proceedings. LEOS '97. 10th Annual Meeting IEEE Lasers and Electro-Optics Society 1997 Annual Meeting ◽

10.1109/leos.1997.645385 ◽

2002 ◽

Author(s):

G. David ◽

J.F. Whitaker ◽

E.J. Ledbetter ◽

T.R. Weatherford ◽

D. Fouts ◽

...

Keyword(s):

Digital Circuit ◽

Circuit Testing ◽

Sampling Probe ◽

Digital Circuit Testing ◽

Photoconductive Sampling

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Digital Circuit Testing on a Network of Workstations

1994 International Conference on Parallel Processing Vol. 3 ◽

10.1109/icpp.1994.89 ◽

1994 ◽

Author(s):

S. Srinivasan ◽

J.H. Aylor

Keyword(s):

Digital Circuit ◽

Circuit Testing ◽

Network Of Workstations ◽

Digital Circuit Testing

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Digital circuit testing and design for testability

Design of Logic Systems ◽

10.1007/978-1-4899-6856-2_10 ◽

1992 ◽

pp. 403-455

Author(s):

D. Lewin ◽

D. Protheroe

Keyword(s):

Digital Circuit ◽

Design For Testability ◽

Circuit Testing ◽

Digital Circuit Testing

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Digital Circuit Testing

10.1016/c2009-0-21581-9 ◽

1991 ◽

Keyword(s):

Digital Circuit ◽

Circuit Testing ◽

Digital Circuit Testing

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Digital Circuit Testing Methods: An Analysis of Modern Problems

2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus) ◽

10.1109/elconrus51938.2021.9396341 ◽

2021 ◽

Author(s):

Artyom A. Shvachko ◽

Timur N. Prokopenko ◽

Elena S. Yanakova ◽

Vyacheslav K. Kozlov

Keyword(s):

Digital Circuit ◽

Testing Methods ◽

Circuit Testing ◽

Digital Circuit Testing

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Test the S27 Benchmark Circuit by Using Built In Self Test and Test Pattern Generation

International Journal of Advanced Research in Electrical Electronics and Instrumentation Engineering ◽

10.15662/ijareeie.2014.0308083 ◽

2014 ◽

Vol 03 (08) ◽

pp. 11487-11495

Author(s):

S. Nagaraju ◽

Ch.N.L. Sujatha ◽

J.S.S. Ramaraju

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Benchmark Circuit ◽

Self Test ◽

Built In Self Test

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Memory Implementation in a System on Chip with Built-in Self-Test and Recovery Tools

Proceedings of Universities ELECTRONICS ◽

10.24151/1561-5405-2019-24-3-239-247 ◽

2019 ◽

Vol 24 (3) ◽

pp. 239-247

Author(s):

Vladimir G. Ryabtsev ◽

◽

Sergey V. Volobuev ◽

Keyword(s):

System On Chip ◽

Self Test ◽

Built In Self Test ◽

On Chip ◽

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