2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)
Latest Publications

TOTAL DOCUMENTS

36

(FIVE YEARS 36)

H-INDEX

1

(FIVE YEARS 1)

Published By IEEE

9781728140087

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Influence of series resistance on the experimental extraction of FinFET noise parameters

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107908 ◽

2020 ◽

Author(s):

Angeliki Tataridou ◽

Gerard Ghibaudo ◽

Christoforos Theodorou

Keyword(s):

Series Resistance ◽

Noise Parameters

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Investigation of Test Structures for the Characterization of Very Fast Electro Static Discharge Events

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107924 ◽

2020 ◽

Author(s):

Matt Lauderdale ◽

Emmanuel Onyegam ◽

Scott Ruth ◽

Alex Gerdemann

Keyword(s):

Static Discharge

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Characterization of parametric mismatch attributable to plastic chip encapsulation

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107916 ◽

2020 ◽

Author(s):

Hans Tuinhout ◽

Andrei Damian ◽

Adrie Zegers-van Duijnhoven

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Test Structure for Measuring the Selectivity in Vapour Etch Processes

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107934 ◽

2020 ◽

Author(s):

Markus Ronde ◽

Anthony J. Walton ◽

Jonathan G. Terry

Keyword(s):

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Multiscale modeling of CeO2/La2 O3 stacks for material/defect characterization

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107922 ◽

2020 ◽

Author(s):

Behnood Dianat ◽

Andrea Padovani ◽

Luca Larcher

Keyword(s):

Multiscale Modeling ◽

Defect Characterization

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Experimental Set-Up For Novel Energy Efficient Charge-based Resistive RAM (RRAM) Switching

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107936 ◽

2020 ◽

Author(s):

P. Trotti ◽

G. Pillonet ◽

G. Molas ◽

S. Oukassi ◽

E. Nowak

Keyword(s):

Energy Efficient ◽

Resistive Ram ◽

Efficient Charge ◽

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Experimental and simulation analysis of carrier lifetimes in GaAs/AlGaAs Avalanche Photo-Diodes

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107920 ◽

2020 ◽

Author(s):

F. Driussi ◽

A. Pilotto ◽

D. De Belli ◽

M. Antonelli ◽

F. Arfelli ◽

...

Keyword(s):

Simulation Analysis ◽

Carrier Lifetimes

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OxRAM BER Scaling Trends on 4 kb Mixed-Diameter Test Vehicle

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107927 ◽

2020 ◽

Author(s):

J. Sandrini ◽

C. Cagli ◽

L. Grenouillet ◽

N. Castellani ◽

V. Meli ◽

...

Keyword(s):

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Drop-in test structure chip to visualize residual stress of Ru/Cu film grown by atomic layer deposition and supercritical fluid deposition

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107904 ◽

2020 ◽

Author(s):

Naoto Usami ◽

Etsuko Ota ◽

Akio Higo ◽

Takeshi Momose ◽

Yoshio Mita

Keyword(s):

Residual Stress ◽

Atomic Layer Deposition ◽

Supercritical Fluid ◽

Atomic Layer ◽

Test Structure ◽

Layer Deposition ◽

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Calibration of CBCM Measurement Hardware

2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts48187.2020.9107913 ◽

2020 ◽

Author(s):

Brad Smith ◽

Emmanuel Onyegam ◽

Donald Hall ◽

Bill Verzi

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