Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC
Latest Publications

TOTAL DOCUMENTS

126

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Published By IEEE Comput. Soc. Press

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Towards incorporating device parameter variations in timing analysis

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326855 ◽

2002 ◽

Cited By ~ 7

Author(s):

M. Sivaraman ◽

A.J. Satrojwas

Keyword(s):

Timing Analysis ◽

Device Parameter ◽

Parameter Variations

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Bug identification of a real chip design by symbolic model checking

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326886 ◽

2002 ◽

Cited By ~ 22

Author(s):

B. Chen ◽

M. Yamazaki ◽

M. Fujita

Keyword(s):

Model Checking ◽

Symbolic Model Checking ◽

Chip Design ◽

Symbolic Model

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Transforming linear systems for joint latency and throughput optimization

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326866 ◽

2002 ◽

Cited By ~ 13

Author(s):

M.B. Srivastava ◽

M. Potkonjak

Keyword(s):

Linear Systems ◽

Throughput Optimization

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Incorporating the controller effects during register transfer level synthesis

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326916 ◽

2002 ◽

Cited By ~ 4

Author(s):

C. Ramachandran ◽

F.J. Kurdahi

Keyword(s):

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BIST test pattern generators for stuck-open and delay testing

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326862 ◽

2002 ◽

Cited By ~ 22

Author(s):

C.-A. Chen ◽

S.K. Gupta

Keyword(s):

Test Pattern ◽

Delay Testing ◽

Pattern Generators

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A VLSI implementation of parallel fast Fourier transform

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326869 ◽

2002 ◽

Cited By ~ 7

Author(s):

A. Vacher ◽

M. Benkhebbab ◽

A. Guyot ◽

T. Rousseau ◽

A. Skaf

Keyword(s):

Fourier Transform ◽

Fast Fourier Transform ◽

Vlsi Implementation

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Implementation of a CORDIC processor for CFFT computation in gallium arsenide technology

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326871 ◽

2002 ◽

Author(s):

R. Sarmiento ◽

K. Eshraghian

Keyword(s):

Gallium Arsenide

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Interface controller synthesis from requirement specifications

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326847 ◽

2002 ◽

Cited By ~ 3

Author(s):

F. Korf ◽

R. Schlor

Keyword(s):

Controller Synthesis ◽

Requirement Specifications

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Maximizing the throughput of high performance DSP applications using behavioral transformations

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326903 ◽

2002 ◽

Cited By ~ 10

Author(s):

Shan-Hsi Huang ◽

J.M. Rabaey

Keyword(s):

High Performance ◽

Behavioral Transformations ◽

Dsp Applications

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Distributed fault simulation for sequential circuits by pattern partitioning

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326801 ◽

2002 ◽

Author(s):

Wen Ching Wu ◽

Chung Len Lee ◽

Jwu E Chen ◽

Won Yih Lin

Keyword(s):

Fault Simulation ◽

Sequential Circuits

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Proceedings of European Design and Test Conference EDAC-ETC-EUROASICLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc. Press

Towards incorporating device parameter variations in timing analysis

Bug identification of a real chip design by symbolic model checking

Transforming linear systems for joint latency and throughput optimization

Incorporating the controller effects during register transfer level synthesis

BIST test pattern generators for stuck-open and delay testing

A VLSI implementation of parallel fast Fourier transform

Implementation of a CORDIC processor for CFFT computation in gallium arsenide technology

Interface controller synthesis from requirement specifications

Maximizing the throughput of high performance DSP applications using behavioral transformations

Distributed fault simulation for sequential circuits by pattern partitioning

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC
Latest Publications