Advances in Imaging and Electron Physics
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9780123943965
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fundamental Aspects of Near-Field Emission Scanning Electron Microscopy

2012 ◽  
pp. 227-258 ◽  
Author(s):  
D.A. Zanin ◽  
H. Cabrera ◽  
L.G. De Pietro ◽  
M. Pikulski ◽  
M. Goldmann ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Field Emission ◽  
Near Field ◽  
Scanning Electron

Electron Microscopy Studies on Magnetic L10-Type FePd Nanoparticles

2012 ◽  
pp. 165-225 ◽  
Author(s):  
Kazuhisa Sato ◽  
Toyohiko J. Konno ◽  
Yoshihiko Hirotsu
Keyword(s):  
Electron Microscopy

Scanning Helium Ion Microscopy

2012 ◽  
pp. 65-148 ◽  
Author(s):  
Ray Hill ◽  
John A. Notte ◽  
Larry Scipioni
Keyword(s):  
Helium Ion ◽  
Ion Microscopy

Precession Electron Diffraction

2012 ◽  
pp. 1-63 ◽  
Author(s):  
Alexander S. Eggeman ◽  
Paul A. Midgley
Keyword(s):  
Electron Diffraction ◽  
Precession Electron Diffraction
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