Handbook of Charged Particle Optics
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Published By CRC Press

9781315219882
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Magnetic Lenses for Electron Microscopy

2017 ◽  
pp. 129-159
Author(s):  
Katsushige Tsuno
Keyword(s):  
Electron Microscopy

Gas Field Ionization Sources

2017 ◽  
pp. 87-128 ◽  
Author(s):  
Richard G. Forbes
Keyword(s):  
Field Ionization ◽  
Gas Field ◽  
Ionization Sources

Focused Ion Beams

2017 ◽  
pp. 523-600
Author(s):  
M. Utlaut
Keyword(s):  
Ion Beams ◽  
Focused Ion Beams

Liquid Metal Ion Sources

2017 ◽  
pp. 29-86 ◽  
Author(s):  
Richard G. Forbes ◽  
Graeme L. R. Mair
Keyword(s):  
Liquid Metal ◽  
Metal Ion ◽  
Ion Sources

Aberration Correction in Electron Microscopy

2017 ◽  
pp. 601-640
Author(s):  
Ondrej L. Krivanek ◽  
Niklas Dellby ◽  
Matthew F. Murfitt
Keyword(s):  
Electron Microscopy ◽  
Aberration Correction

The Scanning Electron Microscope *

2017 ◽  
pp. 437-496 ◽  
Author(s):  
András E. Vladár ◽  
Michael T. Postek
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Scanning Electron

Resolution

2017 ◽  
pp. 391-435
Author(s):  
Mitsugu Sato

Space Charge and Statistical Coulomb Effects

2017 ◽  
pp. 341-389
Author(s):  
Pieter Kruit ◽  
Guus H. Jansen
Keyword(s):  
Space Charge ◽  
Coulomb Effects

Aberrations

2017 ◽  
pp. 209-340 ◽  
Author(s):  
Peter W. Hawkes

Electrostatic Lenses

2017 ◽  
pp. 161-208
Author(s):  
Bohumila Lencová
Keyword(s):  
Electrostatic Lenses
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