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ARFTG 63rd Conference, Spring 2004
Latest Publications
TOTAL DOCUMENTS
47
(FIVE YEARS 0)
H-INDEX
8
(FIVE YEARS 0)
Published By IEEE
0780383710
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
A 4-term reflectorneter error model for systems with variable coupling
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387870
◽
2005
◽
Author(s):
J. Martens
Keyword(s):
Error Model
◽
Variable Coupling
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A first step towards a wave-based 'stochastic' calibration for multi-port vectorial network analyzers
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387872
◽
2005
◽
Cited By ~ 2
Author(s):
Y. Rolain
◽
W. Van Moer
◽
D. DeGroot
Keyword(s):
Network Analyzers
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Large-signal on-wafer characterization of RF conduction characteristics
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387875
◽
2005
◽
Author(s):
P.H. Ladbrooke
◽
J.P. Bridge
◽
N. Goodship
Keyword(s):
Large Signal
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Extension of the hammerstein model for power amplifier applications
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387868
◽
2005
◽
Cited By ~ 13
Author(s):
M. Isaksson
◽
D. Wisell
Keyword(s):
Power Amplifier
◽
Hammerstein Model
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DUT input impedance measurement in an automated load-pull system
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387874
◽
2005
◽
Author(s):
M. Majerus
Keyword(s):
Input Impedance
◽
Impedance Measurement
◽
Pull System
◽
Load Pull
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Nonlinear large-signal scattering parameters: theory and applications
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387873
◽
2005
◽
Cited By ~ 15
Author(s):
J.A. Jargon
◽
K.C. Gupta
◽
D.C. DeGroot
Keyword(s):
Scattering Parameters
◽
Large Signal
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Characterization of dynamics in on-wafer RF MEMS variable - capacitors using RF measurement techniques
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387865
◽
2005
◽
Cited By ~ 3
Author(s):
D. Girbau
◽
A. LAzaro
◽
L. Pradell
Keyword(s):
Rf Mems
◽
Measurement Techniques
◽
Rf Measurement
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Theoretical study of the effects of the parasitic resistances, R/sub D and R/sub s/, on the voltage and current waveform in the transmission line class E PA
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387877
◽
2005
◽
Author(s):
J.R. Loo-Yau
◽
J.A. Reynoso-Hernandez
Keyword(s):
Transmission Line
◽
Theoretical Study
◽
Current Waveform
◽
Class E
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On-wafer I/V measurement setup for the characterization of low-frequency dispersion in electron devices
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387850
◽
2005
◽
Cited By ~ 1
Author(s):
A. Raffo
◽
A. Santarelli
◽
P.A. Traverso
◽
G. Vannini
◽
F. Filicori
Keyword(s):
Low Frequency
◽
Frequency Dispersion
◽
Electron Devices
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Simple PCB based S-parameter extraction method for RF amplifier circuits
ARFTG 63rd Conference, Spring 2004
◽
10.1109/arftg.2004.1387855
◽
2005
◽
Cited By ~ 1
Author(s):
S.C. Choi
◽
J.E. Youm
◽
S.W. Hwang
Keyword(s):
Extraction Method
◽
Parameter Extraction
◽
Rf Amplifier
◽
S Parameter
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