ARFTG 63rd Conference, Spring 2004
Latest Publications

TOTAL DOCUMENTS

47

(FIVE YEARS 0)

H-INDEX

8

(FIVE YEARS 0)

Published By IEEE

0780383710

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

DUT input impedance measurement in an automated load-pull system

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387874 ◽

2005 ◽

Author(s):

M. Majerus

Keyword(s):

Input Impedance ◽

Impedance Measurement ◽

Pull System ◽

Load Pull

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Nonlinear large-signal scattering parameters: theory and applications

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387873 ◽

2005 ◽

Cited By ~ 15

Author(s):

J.A. Jargon ◽

K.C. Gupta ◽

D.C. DeGroot

Keyword(s):

Scattering Parameters ◽

Large Signal

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A 4-term reflectorneter error model for systems with variable coupling

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387870 ◽

2005 ◽

Author(s):

J. Martens

Keyword(s):

Error Model ◽

Variable Coupling

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A first step towards a wave-based 'stochastic' calibration for multi-port vectorial network analyzers

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387872 ◽

2005 ◽

Cited By ~ 2

Author(s):

Y. Rolain ◽

W. Van Moer ◽

D. DeGroot

Keyword(s):

Network Analyzers

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Large-signal on-wafer characterization of RF conduction characteristics

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387875 ◽

2005 ◽

Author(s):

P.H. Ladbrooke ◽

J.P. Bridge ◽

N. Goodship

Keyword(s):

Large Signal

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Extension of the hammerstein model for power amplifier applications

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387868 ◽

2005 ◽

Cited By ~ 13

Author(s):

M. Isaksson ◽

D. Wisell

Keyword(s):

Power Amplifier ◽

Hammerstein Model

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Characterization of dynamics in on-wafer RF MEMS variable - capacitors using RF measurement techniques

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387865 ◽

2005 ◽

Cited By ~ 3

Author(s):

D. Girbau ◽

A. LAzaro ◽

L. Pradell

Keyword(s):

Rf Mems ◽

Measurement Techniques ◽

Rf Measurement

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Theoretical study of the effects of the parasitic resistances, R/sub D and R/sub s/, on the voltage and current waveform in the transmission line class E PA

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387877 ◽

2005 ◽

Author(s):

J.R. Loo-Yau ◽

J.A. Reynoso-Hernandez

Keyword(s):

Transmission Line ◽

Theoretical Study ◽

Current Waveform ◽

Class E

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On-wafer I/V measurement setup for the characterization of low-frequency dispersion in electron devices

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387850 ◽

2005 ◽

Cited By ~ 1

Author(s):

A. Raffo ◽

A. Santarelli ◽

P.A. Traverso ◽

G. Vannini ◽

F. Filicori

Keyword(s):

Low Frequency ◽

Frequency Dispersion ◽

Electron Devices

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Base-band impedance control and calibration for on-wafer linearity measurements

ARFTG 63rd Conference, Spring 2004 ◽

10.1109/arftg.2004.1387852 ◽

2005 ◽

Cited By ~ 7

Author(s):

M.J. Pelk ◽

L.C.N. de Vreede ◽

M. Spirito ◽

J.H. Jos

Keyword(s):

Impedance Control ◽

Base Band

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