Advances in Imaging and Electron Physics
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Published By Elsevier

9780128120866

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Contributors

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(17)30096-4 ◽

2017 ◽

pp. vii

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Future Contributions

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(17)30098-8 ◽

2017 ◽

pp. xi-xiii

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A Review of Scanning Electron Microscopy in Near Field Emission Mode

Advances in Imaging and Electron Physics ◽

10.1016/bs.aiep.2017.09.002 ◽

2017 ◽

pp. 39-109 ◽

Author(s):

Taryl L. Kirk

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Field Emission ◽

Emission Mode ◽

Scanning Electron

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New Physical Principle for Interference of Light and Material Particles

Advances in Imaging and Electron Physics ◽

10.1016/bs.aiep.2017.09.001 ◽

2017 ◽

pp. 1-37 ◽

Author(s):

Román Castañeda ◽

Giorgio Matteucci

Keyword(s):

Physical Principle

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Series Editor

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(17)30092-7 ◽

2017 ◽

pp. ii

Keyword(s):

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Preface

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(17)30097-6 ◽

2017 ◽

pp. ix

Author(s):

Peter W. Hawkes

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Energy Analyzing and Energy Selecting Electron Microscopes ✶ ✶Reprinted from Advances in Optical and Electron Microscopy volume 4 (1971) 263–360.

Advances in Imaging and Electron Physics ◽

10.1016/bs.aiep.2017.09.003 ◽

2017 ◽

pp. 147-230 ◽

Author(s):

Allen J.F. Metherell

Keyword(s):

Electron Microscopy ◽

Optical And Electron Microscopy ◽

Electron Microscopes

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Copyright

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(17)30094-0 ◽

2017 ◽

pp. iv

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Index

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(17)30099-x ◽

2017 ◽

pp. 231-234

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Nonscalar Mathematical Morphology

Advances in Imaging and Electron Physics ◽

10.1016/bs.aiep.2017.09.004 ◽

2017 ◽

pp. 111-145

Author(s):

Jasper van de Gronde ◽

Jos B.T.M. Roerdink

Keyword(s):

Mathematical Morphology

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