2017 6th International Symposium on Next Generation Electronics (ISNE)
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9781538630969
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ESD-immunity evaluations of a 40 V nLDMOS with embedded SCRs in the drain side

2017 ◽  
Author(s):  
Shen-Li Chen ◽  
Chih-Ying Yen ◽  
Chih-Hung Yang ◽  
Yi-Cih Wu ◽  
Kuei-Jyun Chen ◽  
...  
Keyword(s):  
Drain Side

Conventional 100V UMOS technology with deeper P+ to improve Ids

2017 ◽  
Author(s):  
Muntha Sai Dheeraj ◽  
Gene Sheu ◽  
Chirag Aryadeep ◽  
S. Krishna Sai ◽  
Sivaji Selvendran ◽  
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DIBL effect gauging the integrity of nano-node n-channel FinFETs

2017 ◽  
Author(s):  
Mu-Chun Wang ◽  
Zih-Yang Rao ◽  
Hao-Yi Liu ◽  
Fu-Yuan Tuan ◽  
Wen-Shiang Liao ◽  
...  
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