Advances in Imaging and Electron Physics
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Published By Elsevier

9780128048122

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Voltage Contrast Modes in a Scanning Electron Microscope and Their Application

Advances in Imaging and Electron Physics ◽

10.1016/bs.aiep.2016.04.010 ◽

2016 ◽

pp. 165-246 ◽

Author(s):

V.G. Dyukov ◽

S.A. Nepijko ◽

G. Schönhense

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Voltage Contrast ◽

Scanning Electron

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Index

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(16)30102-1 ◽

2016 ◽

pp. 247-252

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Contributors

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(16)30099-4 ◽

2016 ◽

pp. vii

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Quantum Entanglement in Photon-Induced Electron Spectroscopy of Atoms and Molecules

Advances in Imaging and Electron Physics ◽

10.1016/bs.aiep.2016.04.008 ◽

2016 ◽

pp. 1-164

Author(s):

N. Chandra ◽

S. Parida

Keyword(s):

Quantum Entanglement ◽

Electron Spectroscopy ◽

Atoms And Molecules

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Copyright

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(16)30097-0 ◽

2016 ◽

pp. iv

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Series Page

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(16)30096-9 ◽

2016 ◽

pp. ii

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Preface

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(16)30100-8 ◽

2016 ◽

pp. ix

Author(s):

Peter W. Hawkes

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Contents of Volumes 151-195

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(16)30103-3 ◽

2016 ◽

pp. 253-260

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Future Contributions

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(16)30101-x ◽

2016 ◽

pp. xi-xiii

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WITHDRAWN: A Review of Scanning Electron Microscopy in Near Field Emission Mode

Advances in Imaging and Electron Physics ◽

10.1016/bs.aiep.2016.04.009 ◽

2016 ◽

pp. e1

Author(s):

T.L. Kirk

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Field Emission ◽

Emission Mode ◽

Scanning Electron

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