Journal of Scientific Conference Proceedings
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Published By American Scientific Publishers

1937-6464, 1937-6456
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Growth Mechanisms of Graphite Nanoflakes

2010 ◽  
Vol 2 (1) ◽  
pp. 24-32
Author(s):  
Bryan Debelak ◽  
Khalid Lafdi
Keyword(s):  
Growth Mechanisms

Material Grinding by Water Jets—Feasibility and Limits

2010 ◽  
Vol 2 (1) ◽  
pp. 8-14 ◽  
Author(s):  
L. M. Hlaváč ◽  
I. M. Hlaváčová ◽  
J. Vašek ◽  
P. Jandačka ◽  
V. Mádr
Keyword(s):  
Water Jets

Particle Characterization of Nanoparticle Materials in Water Jet Mill Device

2010 ◽  
Vol 2 (1) ◽  
pp. 45-48 ◽  
Author(s):  
A. Slíva ◽  
R. Brázda ◽  
J. Zegzulka ◽  
R. Dvorský ◽  
J. Lunáček
Keyword(s):  
Water Jet ◽  
Particle Characterization

Microporous Cordierite Ceramics Prepared from Clay Mineral Mixtures Containing Vermiculite

2010 ◽  
Vol 2 (1) ◽  
pp. 49-52 ◽  
Author(s):  
Marta Valášková ◽  
Gražyna Simha Martynková
Keyword(s):  
Clay Mineral ◽  
Cordierite Ceramics ◽  
Mineral Mixtures

Variations in the Sorptive Properties of Organovermiculites Modified with Hexadecyltrimethylammonium and Hexadecylpyridinium Cations

2010 ◽  
Vol 2 (1) ◽  
pp. 36-41 ◽  
Author(s):  
Daniela Plachá ◽  
Gražyna Simha Martynková ◽  
Mark H. Rümmeli

Vermiculite Filler for Polymeric Nanocomposites: Thermal and Dispersion Study

2010 ◽  
Vol 2 (1) ◽  
pp. 42-44
Author(s):  
G. Simha Martynková ◽  
O. Buchtík ◽  
E. Plevová ◽  
K. Barabaszová ◽  
S. Holešová ◽  
...  
Keyword(s):  
Polymeric Nanocomposites

Surface Plasmon Resonance Arrangement for Refractive Index Specification of Liquid Samples

2010 ◽  
Vol 2 (1) ◽  
pp. 33-35
Author(s):  
Adam Talik ◽  
Michal Lesňák ◽  
Petr Alexa ◽  
Jaromír Pištora
Keyword(s):  
Refractive Index ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Liquid Samples

Surface Characterization of (Fe, Cu)/Si(100) Thin Films

2010 ◽  
Vol 2 (1) ◽  
pp. 53-55
Author(s):  
A. Zolanvari ◽  
H. Sadeghi ◽  
J. Nezamdost
Keyword(s):  
Thin Films ◽  
Surface Characterization
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