Microporous Cordierite Ceramics Prepared from Clay Mineral Mixtures Containing Vermiculite

2010 ◽  
Vol 2 (1) ◽  
pp. 49-52 ◽  
Author(s):  
Marta Valášková ◽  
Gražyna Simha Martynková
Keyword(s):  
Clay Mineral ◽  
Cordierite Ceramics ◽  
Mineral Mixtures

Quantitative Analysis of Clay Mineral Mixtures by X-ray Diffraction

Nature ◽  
1964 ◽  
Vol 204 (4964) ◽  
pp. 1228-1230 ◽  
Author(s):  
A. A. THEISEN ◽  
E. BELLIS
Keyword(s):  
Quantitative Analysis ◽  
Clay Mineral ◽  
X Ray Diffraction ◽  
X Ray ◽  
Mineral Mixtures

Thermal analysis and FT-IR spectroscopy of synthetic clay mineral mixtures

2020 ◽  
Vol 142 (1) ◽  
pp. 507-518 ◽  
Author(s):  
E. Plevova ◽  
L. Vaculikova ◽  
V. Valovicova
Keyword(s):  
Thermal Analysis ◽  
Ir Spectroscopy ◽  
Clay Mineral ◽  
Ft Ir ◽  
Mineral Mixtures ◽  
Synthetic Clay ◽  
Ft Ir Spectroscopy

A method to eliminate the background in X-ray diffraction patterns of oriented clay mineral samples

Clay Minerals ◽  
1981 ◽  
Vol 16 (4) ◽  
pp. 383-393 ◽  
Author(s):  
S. J. Van Der Gaast ◽  
A. J. Vaars
Keyword(s):  
Clay Mineral ◽  
Quantitative Estimate ◽  
Considerable Increase ◽  
The Other ◽  
X Ray Diffraction ◽  
X Ray ◽  
Two Samples ◽  
Diffraction Patterns ◽  
Mineral Mixtures

AbstractA method is described for calculating, and then subtracting, the background from X-ray diffraction patterns of oriented clay mineral samples. Ti-Kα radiation is used and, to minimize the absorption of this radiation by air, a vacuum and helium-flushed device has been developed. This device can be used with other X-ray sources, offering a considerable increase of intensity—e.g. Co-Kα radiation is increased by 125%. With the background-eliminated patterns a better semi-quantitative estimate of the composition of clay mineral mixtures is possible. Small differences in composition of two samples can be identified by subtracting one of the background-eliminated patterns from the other. Using this method, peak maxima of smectite-group minerals can also be accurately determined.

Rapid chemical analysis of the <2 μm clay fraction using an SEM/EDS technique

Clay Minerals ◽  
2007 ◽  
Vol 42 (4) ◽  
pp. 549-562 ◽  
Author(s):  
T. Clayton ◽  
R. B. Pearce
Keyword(s):  
Chemical Analysis ◽  
Clay Mineral ◽  
Clay Fraction ◽  
Additional Treatment ◽  
Chemical Data ◽  
X Ray Diffraction ◽  
Analytical Technique ◽  
Conductive Surface ◽  
Mineral Mixtures ◽  
Analytical Errors

AbstractScanning electron microscopy/energy dispersive spectroscopy (SEM/EDS) analysis of smear slides of oriented <2 mm clay fractions is shown to be a reliable and rapid analytical technique for providing chemical data on clay mineral mixtures. Such smear slides are routinely prepared for clay mineral analysis by X-ray diffraction and the only additional treatment required for chemical analysis by EDS is carbon-coating to form an electronically conductive surface. Using standard clays, mixtures of standard clays, and sediment samples, it is shown that sample thickness, sample heterogeneity and surface roughness do not introduce significant analytical errors, although the presence of non-clay mineral phases such as calcite, dolomite, quartz and pyrite may introduce minor discrepancies. Chemical data complement the XRD analyses and increase their accuracy and reliability.

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