Nanometer Technology Designs High-Quality Delay Tests
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12

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1

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Published By Springer US

9780387764863, 9780387757285

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Hybrid Scan-Based Transition Delay Test

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_5 ◽

2008 ◽

pp. 101-120

Keyword(s):

Transition Delay

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Avoiding Functionally Untestable Faults

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_6 ◽

2008 ◽

pp. 121-134

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Enhanced Launch-Off-Capture

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_4 ◽

2008 ◽

pp. 73-99

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Introduction

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_1 ◽

2008 ◽

pp. 1-28

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Faster-Than-At-Speed Test Considering IR-drop Effects

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_8 ◽

2008 ◽

pp. 157-175

Keyword(s):

Ir Drop ◽

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Testing SoC Interconnects for Signal Integrity

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_12 ◽

2008 ◽

pp. 241-275

Keyword(s):

Signal Integrity

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IR-drop Tolerant At-speed Test Pattern Generation

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_9 ◽

2008 ◽

pp. 177-205

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Ir Drop ◽

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At-speed Test Challenges for Nanometer Technology Designs

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_2 ◽

2008 ◽

pp. 29-43 ◽

Keyword(s):

Nanometer Technology

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Delay Fault Testing in Presence of Maximum Crosstalk

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_11 ◽

2008 ◽

pp. 223-240

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing

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Pattern Generation for Power Supply Noise Analysis

Nanometer Technology Designs High-Quality Delay Tests ◽

10.1007/978-0-387-75728-5_10 ◽

2008 ◽

pp. 207-221

Keyword(s):

Power Supply ◽

Noise Analysis ◽

Pattern Generation ◽

Power Supply Noise ◽

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