2019 IEEE 28th Asian Test Symposium (ATS)
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47
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3
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Published By IEEE

9781728126951
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test

2019 ◽  
Author(s):  
Manobendra Nath Mondal ◽  
Animesh Basak Chowdhury ◽  
Manjari Pradhan ◽  
Susmita Sur-Kolay ◽  
Bhargab B. Bhattacharya
Keyword(s):  
Fault Coverage ◽  
Test Set ◽  
Structure Preserving ◽  
Circuit Under Test

A Structured Approach for Rapid Identification of Fault-Sensitive Nets in Analog Circuits

2019 ◽  
Author(s):  
Sayandeep Sanyal ◽  
Amit Patra ◽  
Pallab Dasgupta ◽  
Mayukh Bhattacharya
Keyword(s):  
Analog Circuits ◽  
Rapid Identification ◽  
Structured Approach

Deep Learning Based Diagnostics for Rowhammer Protection of DRAM Chips

2019 ◽  
Author(s):  
Anirban Chakraborty ◽  
Manaar Alam ◽  
Debdeep Mukhopadhyay
Keyword(s):  
Deep Learning

Net Classification Based on Testability and Netlist Structural Features for Hardware Trojan Detection

2019 ◽  
Author(s):  
Chee Hoo Kok ◽  
Chia Yee Ooi ◽  
Michiko Inoue ◽  
Mehrdad Moghbel ◽  
Sreedharan Baskara Dass ◽  
...  
Keyword(s):  
Structural Features ◽  
Hardware Trojan ◽  
Hardware Trojan Detection ◽  
Trojan Detection

Iterative Parallel Test to Detect and Diagnose Multiple Defects for Digital Microfluidic Biochip

2019 ◽  
Author(s):  
Sourav Ghosh ◽  
Dolan Maity ◽  
Arijit Chowdhury ◽  
Surajit Kumar Roy ◽  
Chandan Giri
Keyword(s):  
Parallel Test ◽  
Multiple Defects ◽  
Digital Microfluidic

Validating Multi-Processor Cache Coherence Mechanisms under Diminished Observability

2019 ◽  
Author(s):  
Binod Kumar ◽  
Atul Kumar Bhosale ◽  
Masahiro Fujita ◽  
Virendra Singh
Keyword(s):  
Cache Coherence
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