2019 IEEE 28th Asian Test Symposium (ATS)
Latest Publications

TOTAL DOCUMENTS

47

(FIVE YEARS 47)

H-INDEX

3

(FIVE YEARS 3)

Published By IEEE

9781728126951

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.000-5 ◽

2019 ◽

Author(s):

Manobendra Nath Mondal ◽

Animesh Basak Chowdhury ◽

Manjari Pradhan ◽

Susmita Sur-Kolay ◽

Bhargab B. Bhattacharya

Keyword(s):

Fault Coverage ◽

Test Set ◽

Structure Preserving ◽

Circuit Under Test

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Reinforcement-Learning-Based Test Program Generation for Software-Based Self-Test

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.00013 ◽

2019 ◽

Author(s):

Ching-Yuan Chen ◽

Jiun-Lang Huang

Keyword(s):

Reinforcement Learning ◽

Test Program ◽

Program Generation ◽

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A Structured Approach for Rapid Identification of Fault-Sensitive Nets in Analog Circuits

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.00025 ◽

2019 ◽

Author(s):

Sayandeep Sanyal ◽

Amit Patra ◽

Pallab Dasgupta ◽

Mayukh Bhattacharya

Keyword(s):

Analog Circuits ◽

Rapid Identification ◽

Structured Approach

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Machine Learning Assisted Accurate Estimation of Usage Duration and Manufacturer for Recycled and Counterfeit Flash Memory Detection

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.000-1 ◽

2019 ◽

Author(s):

Saranyu Chattopadhyay ◽

Preeti Kumari ◽

Biswajit Ray ◽

Rajat Subhra Chakraborty

Keyword(s):

Machine Learning ◽

Flash Memory ◽

Accurate Estimation

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Deep Learning Based Diagnostics for Rowhammer Protection of DRAM Chips

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.00016 ◽

2019 ◽

Author(s):

Anirban Chakraborty ◽

Manaar Alam ◽

Debdeep Mukhopadhyay

Keyword(s):

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Net Classification Based on Testability and Netlist Structural Features for Hardware Trojan Detection

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.00020 ◽

2019 ◽

Author(s):

Chee Hoo Kok ◽

Chia Yee Ooi ◽

Michiko Inoue ◽

Mehrdad Moghbel ◽

Sreedharan Baskara Dass ◽

...

Keyword(s):

Structural Features ◽

Hardware Trojan ◽

Hardware Trojan Detection ◽

Trojan Detection

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Author Index

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.00048 ◽

2019 ◽

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Iterative Parallel Test to Detect and Diagnose Multiple Defects for Digital Microfluidic Biochip

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.00027 ◽

2019 ◽

Author(s):

Sourav Ghosh ◽

Dolan Maity ◽

Arijit Chowdhury ◽

Surajit Kumar Roy ◽

Chandan Giri

Keyword(s):

Parallel Test ◽

Multiple Defects ◽

Digital Microfluidic

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Efficient Testing of Physically Unclonable Functions for Uniqueness

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.00022 ◽

2019 ◽

Author(s):

Leandro Santiago de Araujo ◽

Vinay C. Patil ◽

Leandro Augusto Justen Marzulo ◽

Felipe Maia Galvao Franca ◽

Sandip Kundu

Keyword(s):

Physically Unclonable Functions

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ATS 2019 Student Committee

2019 IEEE 28th Asian Test Symposium (ATS) ◽

10.1109/ats47505.2019.00-16 ◽

2019 ◽

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