Advances in Scanning Probe Microscopy - Advances in Materials Research
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Published By Springer Berlin Heidelberg

9783642630842, 9783642569494

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Scanning Tunneling Microscopy of III–V Compound Semiconductor (001) Surfaces

Advances in Scanning Probe Microscopy - Advances in Materials Research ◽

10.1007/978-3-642-56949-4_8 ◽

2000 ◽

pp. 193-282

Author(s):

Qi-Kun Xue ◽

T. Hashizume ◽

T. Sakurai

Keyword(s):

Scanning Tunneling Microscopy ◽

Compound Semiconductor ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Mesoscopic Work Function Measurement by Scanning Tunneling Microscopy

Advances in Scanning Probe Microscopy - Advances in Materials Research ◽

10.1007/978-3-642-56949-4_7 ◽

2000 ◽

pp. 167-191 ◽

Cited By ~ 3

Author(s):

Y. Hasegawa ◽

J. F. Jia ◽

T. Sakurai ◽

Z. Q. Li ◽

K. Ohno ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Work Function ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Function Measurement

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Theoretical Insights into Fullerenes Adsorbed on Surfaces: Comparison with STM Studies

Advances in Scanning Probe Microscopy - Advances in Materials Research ◽

10.1007/978-3-642-56949-4_5 ◽

2000 ◽

pp. 113-142 ◽

Cited By ~ 1

Author(s):

Kaoru Ohno ◽

Yoshiyuki Kawazoe

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Application of Atom Manipulation for Fabricating Nanoscale and Atomic-Scale Structures on Si Surfaces

Advances in Scanning Probe Microscopy - Advances in Materials Research ◽

10.1007/978-3-642-56949-4_4 ◽

2000 ◽

pp. 91-112

Author(s):

T. Hashizume ◽

S. Heike ◽

T. Hitosugi ◽

K. Kitazawa

Keyword(s):

Atomic Scale ◽

Atom Manipulation ◽

Scale Structures

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The Theoretical Basis of Scanning Tunneling Microscopy for Semiconductors — First-Principles Electronic Structure Theory for Semiconductor Surfaces

Advances in Scanning Probe Microscopy - Advances in Materials Research ◽

10.1007/978-3-642-56949-4_2 ◽

2000 ◽

pp. 43-64

Author(s):

Takahisa Ohno

Keyword(s):

Electronic Structure ◽

Scanning Tunneling Microscopy ◽

First Principles ◽

Theoretical Basis ◽

Electronic Structure Theory ◽

Structure Theory ◽

Scanning Tunneling ◽

Semiconductor Surfaces ◽

Tunneling Microscopy

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Theory of Scanning Probe Microscopy

Advances in Scanning Probe Microscopy - Advances in Materials Research ◽

10.1007/978-3-642-56949-4_1 ◽

2000 ◽

pp. 1-41 ◽

Cited By ~ 52

Author(s):

Naruo Sasaki ◽

Masaru Tsukada

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Adsorption of Fullerenes on Semiconductor and Metal Surfaces Investigated by Field-Ion Scanning Tunneling Microscopy

Advances in Scanning Probe Microscopy - Advances in Materials Research ◽

10.1007/978-3-642-56949-4_9 ◽

2000 ◽

pp. 283-338

Author(s):

T. Hashizume ◽

T. Sakurai

Keyword(s):

Scanning Tunneling Microscopy ◽

Metal Surfaces ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Apparent Barrier Height and Barrier-Height Imaging of Surfaces

Advances in Scanning Probe Microscopy - Advances in Materials Research ◽

10.1007/978-3-642-56949-4_6 ◽

2000 ◽

pp. 143-165 ◽

Cited By ~ 2

Author(s):

Akira Sakai

Keyword(s):

Barrier Height ◽

Barrier Height Imaging

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Atomic Structure of 6H-SiC (0001) and (000 $$\bar{1}$$ )

Advances in Scanning Probe Microscopy - Advances in Materials Research ◽

10.1007/978-3-642-56949-4_3 ◽

2000 ◽

pp. 65-90 ◽

Cited By ~ 3

Author(s):

L. Li ◽

T. Sakurai

Keyword(s):

Atomic Structure

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Advances in Scanning Probe Microscopy - Advances in Materials ResearchLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Scanning Tunneling Microscopy of III–V Compound Semiconductor (001) Surfaces

Mesoscopic Work Function Measurement by Scanning Tunneling Microscopy

Theoretical Insights into Fullerenes Adsorbed on Surfaces: Comparison with STM Studies

Application of Atom Manipulation for Fabricating Nanoscale and Atomic-Scale Structures on Si Surfaces

The Theoretical Basis of Scanning Tunneling Microscopy for Semiconductors — First-Principles Electronic Structure Theory for Semiconductor Surfaces

Theory of Scanning Probe Microscopy

Adsorption of Fullerenes on Semiconductor and Metal Surfaces Investigated by Field-Ion Scanning Tunneling Microscopy

Apparent Barrier Height and Barrier-Height Imaging of Surfaces

Atomic Structure of 6H-SiC (0001) and (000 $$\bar{1}$$ )

Advances in Scanning Probe Microscopy - Advances in Materials Research
Latest Publications