2011 12th Latin American Test Workshop (LATW)
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TOTAL DOCUMENTS

57

(FIVE YEARS 0)

H-INDEX

6

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Published By IEEE

9781457714894, 9781457714900

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Communication fault injection for multi-protocol Java applications testing

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985899 ◽

2011 ◽

Author(s):

Cristina Ciprandi Menegotto ◽

Taisy Silva Weber

Keyword(s):

Fault Injection

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A TLM-based approach to functional verification of hardware components at different abstraction levels

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985902 ◽

2011 ◽

Cited By ~ 7

Author(s):

Mikhail Chupilko ◽

Alexander Kamkin

Keyword(s):

Functional Verification ◽

Abstraction Levels

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Behavioral-level thermal- and aging-estimation flow

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985908 ◽

2011 ◽

Cited By ~ 5

Author(s):

Sven Rosinger ◽

Malte Metzdorf ◽

Domenik Helms ◽

Wolfgang Nebel

Keyword(s):

Behavioral Level

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An approach for clustering test data

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985890 ◽

2011 ◽

Cited By ~ 1

Author(s):

Alexandre Rafael Lenz ◽

Aurora Pozo ◽

Silvia Regina Vergilio

Keyword(s):

Test Data ◽

Clustering Test

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Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985896 ◽

2011 ◽

Cited By ~ 9

Author(s):

Vladimir Pasca ◽

Lorena Anghel ◽

Mounir Benabdenbi

Keyword(s):

Self Test ◽

Built In Self Test

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Reviewers

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985937 ◽

2011 ◽

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Functional verification of logic modules for a Gigabit Ethernet switch

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985930 ◽

2011 ◽

Author(s):

Jorge Tonfat ◽

Gustavo Neuberger ◽

Ricardo Reis

Keyword(s):

Functional Verification ◽

Gigabit Ethernet ◽

Logic Modules ◽

Ethernet Switch

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Test power reduction via deterministic alignment of stimulus and response bits

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985911 ◽

2011 ◽

Cited By ~ 3

Author(s):

Sobeeh Almukhaizim ◽

Eman AlQuraishi ◽

Ozgur Sinanoglu

Keyword(s):

Power Reduction ◽

Test Power ◽

Test Power Reduction

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Testing for faults, looking for defects

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985888 ◽

2011 ◽

Cited By ~ 3

Author(s):

Vishwani D. Agrawal

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Reliability enhancement via Sleep Transistors

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985901 ◽

2011 ◽

Cited By ~ 1

Author(s):

Frank Sill Torres ◽

Claas Cornelius ◽

Dirk Timmermann

Keyword(s):

Sleep Transistors ◽

Reliability Enhancement

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