Helium Ion Microscopy - NanoScience and Technology
Latest Publications

TOTAL DOCUMENTS

19

(FIVE YEARS 0)

H-INDEX

5

(FIVE YEARS 0)

Published By Springer International Publishing

9783319419886, 9783319419909

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The Helium Ion Microscope

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_1 ◽

2016 ◽

pp. 3-30 ◽

Author(s):

John Notte ◽

Jason Huang

Keyword(s):

Download Full-text

Focused Helium and Neon Ion Beam Modification of High-T C Superconductors and Magnetic Materials

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_17 ◽

2016 ◽

pp. 415-445 ◽

Author(s):

Shane A. Cybart ◽

Rantej Bali ◽

Gregor Hlawacek ◽

Falk Röder ◽

Jürgen Fassbender

Keyword(s):

Magnetic Materials ◽

Ion Beam ◽

Ion Beam Modification ◽

Download Full-text

Single Atom Gas Field Ion Sources for Scanning Ion Microscopy

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_2 ◽

2016 ◽

pp. 31-61 ◽

Author(s):

Radovan Urban ◽

Robert A. Wolkow ◽

Jason L. Pitters

Keyword(s):

Ion Sources ◽

Single Atom ◽

Gas Field ◽

Download Full-text

Helium Ion Microscope Fabrication of Solid-State Nanopore Devices for Biomolecule Analysis

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_18 ◽

2016 ◽

pp. 447-470 ◽

Author(s):

Osama K. Zahid ◽

Adam R. Hall

Keyword(s):

Solid State ◽

Download Full-text

Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm Scale

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_12 ◽

2016 ◽

pp. 265-295 ◽

Author(s):

Rene Heller ◽

Nico Klingner ◽

Gregor Hlawacek

Keyword(s):

Elemental Compositions ◽

Microscope Imaging

Download Full-text

Monte Carlo Simulations of Focused Ion Beam Induced Processing

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_4 ◽

2016 ◽

pp. 89-118 ◽

Author(s):

Rajendra Timilsina ◽

Philip D. Rack

Keyword(s):

Monte Carlo ◽

Monte Carlo Simulations ◽

Focused Ion Beam ◽

Download Full-text

HIM Applications in Combustion Science: Imaging of Catalyst Surfaces and Nascent Soot

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_8 ◽

2016 ◽

pp. 187-203 ◽

Author(s):

Henning Vieker ◽

André Beyer

Keyword(s):

Catalyst Surfaces

Download Full-text

Helium Ion Microscopy for Two-Dimensional Materials

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_11 ◽

2016 ◽

pp. 245-262 ◽

Author(s):

Yangbo Zhou ◽

Daniel S. Fox ◽

Hongzhou Zhang

Keyword(s):

Two Dimensional ◽

Two Dimensional Materials ◽

Download Full-text

Ionoluminescence

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_14 ◽

2016 ◽

pp. 325-351 ◽

Author(s):

Vasilisa Veligura ◽

Gregor Hlawacek

Download Full-text

Direct–Write Milling and Deposition with Noble Gases

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_15 ◽

2016 ◽

pp. 355-393 ◽

Author(s):

Ivan Shorubalko ◽

Lex Pillatsch ◽

Ivo Utke

Keyword(s):

Noble Gases ◽

Download Full-text