Proceedings International Test Conference 2001 (Cat. No.01CH37260)
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130

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27

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Test path simulation and characterisation

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966658 ◽

2002 ◽

Author(s):

K. Helmreich

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Two-dimensional test data compression for scan-based deterministic BIST

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966712 ◽

2002 ◽

Author(s):

Hua-Guo Liang ◽

S. Hellebrand ◽

H.-J. Wunderlich

Keyword(s):

Data Compression ◽

Test Data ◽

Two Dimensional ◽

Test Data Compression ◽

Deterministic Bist

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On efficient error diagnosis of digital circuits

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966688 ◽

2002 ◽

Author(s):

N. Sridhar ◽

M.S. Hsiao

Keyword(s):

Digital Circuits ◽

Error Diagnosis

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Optimal production test times through adaptive test programming

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966714 ◽

2002 ◽

Author(s):

S. Benner ◽

O. Boroffice

Keyword(s):

Production Test ◽

Optimal Production ◽

Adaptive Test ◽

Test Programming

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Low hardware overhead scan based 3-weight weighted random BIST

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966709 ◽

2002 ◽

Author(s):

Seongrnoon Wang

Keyword(s):

Hardware Overhead

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Test vector encoding using partial LFSR reseeding

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966711 ◽

2002 ◽

Author(s):

C.V. Krishna ◽

A. Jas ◽

N.A. Touba

Keyword(s):

Test Vector ◽

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A study of bridging defect probabilities on a Pentium (TM) 4 CPU

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966689 ◽

2002 ◽

Author(s):

V. Krishnaswamy ◽

A.B. Ma ◽

P. Vishakantaiah

Keyword(s):

Bridging Defect

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March-based RAM diagnosis algorithms for stuck-at and coupling faults

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966697 ◽

2002 ◽

Author(s):

Jin-Fu Li ◽

Kuo-Liang Cheng ◽

Chih-Tsun Huang ◽

Cheng-Wen Wu

Keyword(s):

Coupling Faults

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Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966641 ◽

2002 ◽

Author(s):

J.T. Chen ◽

J. Khare ◽

K. Walker ◽

S. Shaikh ◽

J. Rajski ◽

...

Keyword(s):

Process Monitoring ◽

Manufacturing Process ◽

Test Response ◽

Embedded Memories

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Using a hierarchical DfT methodology in high frequency processor designs for improved delay fault testability

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966663 ◽

2002 ◽

Author(s):

M. Kessler ◽

G. Kiefer ◽

J. Leenstra ◽

K. Schunemann ◽

T. Schwarz ◽

...

Keyword(s):

High Frequency ◽

Delay Fault ◽

Processor Designs

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