2009 10th Latin American Test Workshop
Latest Publications

TOTAL DOCUMENTS

46

(FIVE YEARS 0)

H-INDEX

5

(FIVE YEARS 0)

Published By IEEE

9781424442072

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Minimization of incompletely specified finite state machines based on distinction graphs

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813796 ◽

2009 ◽

Author(s):

Alex Alberto ◽

Adenilso Simao

Keyword(s):

Finite State Machines ◽

State Machines ◽

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Study of SEU effects in a Turbo Decoder Bit Error Rate

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813797 ◽

2009 ◽

Author(s):

M. Portela-Garcia ◽

M. Garcia-Valderas ◽

C. Lopez-Ongil ◽

L. Entrena ◽

B. Lestriez ◽

...

Keyword(s):

Bit Error Rate ◽

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Measurement and control for risk-based test cases and activities

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813802 ◽

2009 ◽

Author(s):

Ellen Souza ◽

Cristine Gusmao ◽

Keldjan Alves ◽

Julio Venancio ◽

Renata Melo

Keyword(s):

And Control ◽

Measurement And Control

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Fault tolerance assessment of PIC microcontroller based on fault injection

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813808 ◽

2009 ◽

Author(s):

Ashkan Eghbal ◽

Hamid R. Zarandi ◽

Pooria M. Yaghini

Keyword(s):

Fault Tolerance ◽

Fault Injection

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High-Level Decision Diagrams based coverage metrics for verification and test

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813792 ◽

2009 ◽

Author(s):

Maksim Jenihhin ◽

Jaan Raik ◽

Anton Chepurov ◽

Uljana Reinsalu ◽

Raimund Ubar

Keyword(s):

Decision Diagrams ◽

Coverage Metrics ◽

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A modern look at the CMOS stuck-open fault

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813818 ◽

2009 ◽

Author(s):

Roberto Gomez ◽

Victor Champac ◽

Chuck Hawkins ◽

Jaume Segura

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Measuring the effectiveness of symmetric and asymmetric transistor sizing for Single Event Transient mitigation in CMOS 90nm technologies

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813789 ◽

2009 ◽

Author(s):

Thiago Assis ◽

Fernanda Lima Kastensmidt ◽

Gilson Wirth ◽

Ricardo Reis

Keyword(s):

Single Event ◽

Single Event Transient ◽

Transistor Sizing

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On the derivation of a minimum test set in high quality transition testing

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813784 ◽

2009 ◽

Author(s):

Tsuyoshi Iwagaki ◽

Mineo Kaneko

Keyword(s):

High Quality ◽

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A practical methodology for experimental fault injection to test complex network-based systems

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813788 ◽

2009 ◽

Author(s):

Cristina C. Menegotto ◽

Taisy S. Weber ◽

Raul F. Weber

Keyword(s):

Complex Network ◽

Fault Injection

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On-line test and monitoring of multi-processor SoCs: A software-based approach

2009 10th Latin American Test Workshop ◽

10.1109/latw.2009.4813798 ◽

2009 ◽

Author(s):

Mounir Benabdenbi ◽

Francois Pecheux ◽

Etienne Faure

Keyword(s):

On Line ◽

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