2013 IEEE 31st VLSI Test Symposium (VTS)
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9781467355421, 9781467355438
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Testing retention flip-flops in power-gated designs

2013 ◽  
Author(s):  
Hao-Wen Hsu ◽  
Shih-Hua Kuo ◽  
Wen-Hsiang Chang ◽  
Shi-Hao Chen ◽  
Ming-Tung Chang ◽  
...  

A multi-faceted approach to FPGA-based Trojan circuit detection

2013 ◽  
Author(s):  
M. Patterson ◽  
A. Mills ◽  
R. Scheel ◽  
J. Tillman ◽  
E. Dye ◽  
...  

scholarly journals Identification of critical variables using an FPGA-based fault injection framework

2013 ◽  
Author(s):  
A. Riefert ◽  
J. Muller ◽  
M. Sauer ◽  
W. Burgard ◽  
B. Becker
Keyword(s):  
Fault Injection
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