2013 IEEE 31st VLSI Test Symposium (VTS)
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9781467355421, 9781467355438
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A multi-faceted approach to FPGA-based Trojan circuit detection

2013 ◽  
Author(s):  
M. Patterson ◽  
A. Mills ◽  
R. Scheel ◽  
J. Tillman ◽  
E. Dye ◽  
...  

Innovative practices session 9C: Yield improvement: Challenges and directions

2013 ◽  
Author(s):  
B. Seshadri ◽  
B. Cory ◽  
S. Mitra
Keyword(s):  
Yield Improvement

Innovative practices session 11C: Resilience

2013 ◽  
Author(s):  
Chen-Yong Cher ◽  
Mohan J. Kumar

Testing retention flip-flops in power-gated designs

2013 ◽  
Author(s):  
Hao-Wen Hsu ◽  
Shih-Hua Kuo ◽  
Wen-Hsiang Chang ◽  
Shi-Hao Chen ◽  
Ming-Tung Chang ◽  
...  

Investigation of gate oxide short in FinFETs and the test methods for FinFET SRAMs

2013 ◽  
Author(s):  
Chen-Wei Lin ◽  
M. C.-T Chao ◽  
Chih-Chieh Hsu
Keyword(s):  
Gate Oxide ◽  
Test Methods ◽  
Gate Oxide Short

Tracing the best test mix through multi-variate quality tracking

2013 ◽  
Author(s):  
B. Arslan ◽  
A. Orailoglu

scholarly journals Identification of critical variables using an FPGA-based fault injection framework

2013 ◽  
Author(s):  
A. Riefert ◽  
J. Muller ◽  
M. Sauer ◽  
W. Burgard ◽  
B. Becker
Keyword(s):  
Fault Injection

Defect-oriented non-intrusive RF test using on-chip temperature sensors

2013 ◽  
Author(s):  
L. Abdallah ◽  
H. Stratigopoulos ◽  
S. Mir ◽  
J. Altet
Keyword(s):  
Temperature Sensors ◽  
Rf Test ◽  
Chip Temperature ◽  
On Chip

Enhanced algorithm of combining trace and scan signals in post-silicon validation

2013 ◽  
Author(s):  
Kihyuk Han ◽  
Joon-Sung Yang ◽  
J. A. Abraham
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