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Test-cost optimization and test-flow selection for 3D-stacked ICs
2013 IEEE 31st VLSI Test Symposium (VTS)
◽
10.1109/vts.2013.6548941
◽
2013
◽
Cited By ~ 14
Author(s):
M. Agrawal
◽
K. Chakrabarty
Keyword(s):
Cost Optimization
◽
Test Cost
◽
Test Flow
◽
Selection For
Download Full-text
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Cited By
References
Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs
2016 IEEE 34th VLSI Test Symposium (VTS)
◽
10.1109/vts.2016.7477263
◽
2016
◽
Cited By ~ 5
Author(s):
Ali Ahmadi
◽
Amit Nahar
◽
Bob Orr
◽
Michael Past
◽
Yiorgos Makris
Keyword(s):
Cost Reduction
◽
Process Variation
◽
Wafer Level
◽
Test Cost
◽
Test Cost Reduction
◽
Probe Test
◽
Test Flow
◽
Selection For
◽
Level Process
◽
Rf Ics
Download Full-text
Test Flow Selection for Stacked Integrated Circuits
Journal of Electronic Testing
◽
10.1007/s10836-019-05813-z
◽
2019
◽
Vol 35
(4)
◽
pp. 425-440
Author(s):
Breeta SenGupta
◽
Dimitar Nikolov
◽
Assmitra Dash
◽
Erik Larsson
Keyword(s):
Integrated Circuits
◽
Test Flow
◽
Selection For
◽
Stacked Integrated Circuits
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Yield Improvement and Test Cost Optimization for 3D Stacked ICs
2011 Asian Test Symposium
◽
10.1109/ats.2011.88
◽
2011
◽
Cited By ~ 8
Author(s):
Said Hamdioui
◽
Mottaqiallah Taouil
Keyword(s):
Cost Optimization
◽
Yield Improvement
◽
Test Cost
Download Full-text
Test cost optimization technique for the pre-bond test of 3D ICs
2012 IEEE 30th VLSI Test Symposium (VTS)
◽
10.1109/vts.2012.6231087
◽
2012
◽
Author(s):
Yong-Xiao Chen
◽
Yu-Jen Huang
◽
Jin-Fu Li
Keyword(s):
Optimization Technique
◽
Cost Optimization
◽
Test Cost
◽
3D Ics
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Attribute‐scale selection for hybrid data with test cost constraint: The approach and uncertainty measures
International Journal of Intelligent Systems
◽
10.1002/int.22678
◽
2021
◽
Author(s):
Shujiao Liao
◽
Yidong Lin
◽
Jinjin Li
◽
Huiling Li
◽
Yuhua Qian
Keyword(s):
Scale Selection
◽
Test Cost
◽
Uncertainty Measures
◽
Hybrid Data
◽
Selection For
Download Full-text
Material Selection for a Curved C-Spar Based on Cost Optimization
Journal of Aircraft
◽
10.2514/1.c000188
◽
2011
◽
Vol 48
(3)
◽
pp. 797-804
◽
Cited By ~ 3
Author(s):
Markus Kaufmann
◽
Dan Zenkert
◽
Malin Åkermo
Keyword(s):
Material Selection
◽
Cost Optimization
◽
Selection For
Download Full-text
Test-Cost Modeling and Optimal Test-Flow Selection of 3-D-Stacked ICs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/tcad.2015.2419227
◽
2015
◽
Vol 34
(9)
◽
pp. 1523-1536
◽
Cited By ~ 9
Author(s):
Mukesh Agrawal
◽
Krishnendu Chakrabarty
Keyword(s):
Cost Modeling
◽
Optimal Test
◽
Test Cost
◽
Test Flow
◽
Selection Of
Download Full-text
Test-cost optimization in a scan-compression architecture using support-vector regression
2017 IEEE 35th VLSI Test Symposium (VTS)
◽
10.1109/vts.2017.7928956
◽
2017
◽
Cited By ~ 5
Author(s):
Zipeng Li
◽
Jonathon E. Colburn
◽
Vinod Pagalone
◽
Kaushik Narayanun
◽
Krishnendu Chakrabarty
Keyword(s):
Support Vector Regression
◽
Cost Optimization
◽
Support Vector
◽
Test Cost
Download Full-text
Using 3D-COSTAR for 2.5D test cost optimization
2013 IEEE International 3D Systems Integration Conference (3DIC)
◽
10.1109/3dic.2013.6702351
◽
2013
◽
Cited By ~ 9
Author(s):
Mottaqiallah Taouil
◽
Said Hamdioui
◽
Erik Jan Marinissen
◽
Sudipta Bhawmik
Keyword(s):
Cost Optimization
◽
Test Cost
Download Full-text
Test Cost Optimization Using Tabu Search
Journal of Software Engineering and Applications
◽
10.4236/jsea.2010.35054
◽
2010
◽
Vol 03
(05)
◽
pp. 477-486
◽
Cited By ~ 5
Author(s):
Anu Sharma
◽
Arpita Jadhav
◽
Praveen Ranjan Srivastava
◽
Renu Goyal
Keyword(s):
Tabu Search
◽
Cost Optimization
◽
Test Cost
Download Full-text
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