2020 IEEE East-West Design & Test Symposium (EWDTS)
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 99)

H-INDEX

(FIVE YEARS 1)

Published By IEEE

9781728198996

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Relationship Between Base Frequency of the Koch-Type Wire Dipole and Various Dimensions

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9224819 ◽

2020 ◽

Author(s):

Ilya Pershin ◽

Dmitrii Tumakov

Keyword(s):

Base Frequency

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IR Drop Estimation and Optimization on DRAM Memory using Machine Learning Algorithms

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9224772 ◽

2020 ◽

Author(s):

Narek Mamikonyan ◽

Nazeli Melikyan ◽

Ruben Musayelyan

Keyword(s):

Machine Learning ◽

Learning Algorithms ◽

Machine Learning Algorithms ◽

Ir Drop

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An Accuracy Improvement of the Neuromorphic Functional Models by Using the Parallel ANN Architecture

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9225034 ◽

2020 ◽

Author(s):

Sergey Mosin

Keyword(s):

Accuracy Improvement ◽

Functional Models

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Antenna Arrays Calibration Using Recursive Least Squares Adaptive Filtering Algorithms Based on Inverse QR Decomposition

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9224860 ◽

2020 ◽

Author(s):

Victor Djigan ◽

Vladislav Kurganov

Keyword(s):

Least Squares ◽

Adaptive Filtering ◽

Antenna Arrays ◽

Qr Decomposition ◽

Recursive Least Squares ◽

Filtering Algorithms

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EWDTS 2020 Copyright Page

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9225048 ◽

2020 ◽

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Geometry-Based Rolling-Stock Identification System Insensitive to Speed Variations

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9224911 ◽

2020 ◽

Author(s):

Valery A. Zasov ◽

Maxim V. Romkin

Keyword(s):

Rolling Stock ◽

Identification System ◽

Stock Identification

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Appraisal of the Effective Number of Bits of the ADC for Sensors with Account for Dynamic Errors

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9225070 ◽

2020 ◽

Author(s):

Leonty Samoilov ◽

Darya Denisenko ◽

Nikolay Prokopenko

Keyword(s):

Effective Number ◽

Dynamic Errors

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Determining the Direction of True Meridian by Micromechanical Gyro

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9225154 ◽

2020 ◽

Author(s):

Vladimir Bogolyubov ◽

Lyalya Bakhtieva

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DRAM Structure with Prioritized Memory Bank using Multi-VT Bit Cells Architecture

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9224821 ◽

2020 ◽

Author(s):

Narek Mamikonyan

Keyword(s):

Memory Bank

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An IoT based Real-time Data-centric Monitoring System for Vaccine Cold Chain

2020 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts50664.2020.9225047 ◽

2020 ◽

Author(s):

Raisa Tahseen Hasanat ◽

MD. Arifur Rahman ◽

Nafees Mansoor ◽

Nabeel Mohammed ◽

Mohammad Shahriar Rahman ◽

...

Keyword(s):

Real Time ◽

Monitoring System ◽

Cold Chain ◽

Time Data ◽

Real Time Data

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2020 IEEE East-West Design & Test Symposium (EWDTS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Relationship Between Base Frequency of the Koch-Type Wire Dipole and Various Dimensions

IR Drop Estimation and Optimization on DRAM Memory using Machine Learning Algorithms

An Accuracy Improvement of the Neuromorphic Functional Models by Using the Parallel ANN Architecture

Antenna Arrays Calibration Using Recursive Least Squares Adaptive Filtering Algorithms Based on Inverse QR Decomposition

EWDTS 2020 Copyright Page

Geometry-Based Rolling-Stock Identification System Insensitive to Speed Variations

Appraisal of the Effective Number of Bits of the ADC for Sensors with Account for Dynamic Errors

Determining the Direction of True Meridian by Micromechanical Gyro

DRAM Structure with Prioritized Memory Bank using Multi-VT Bit Cells Architecture

An IoT based Real-time Data-centric Monitoring System for Vaccine Cold Chain

2020 IEEE East-West Design & Test Symposium (EWDTS)
Latest Publications