Optical Metrology and Inspection for Industrial Applications VII
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53

(FIVE YEARS 53)

H-INDEX

0

(FIVE YEARS 0)

Published By SPIE

9781510639195, 9781510639201

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Front Matter: Volume 11552

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2585822 ◽

2020 ◽

Keyword(s):

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A method for judging faults of 3D body scanner based on standard sphere

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2575354 ◽

2020 ◽

Author(s):

Yu Ren ◽

Feng Zhang ◽

Fangfang Liu ◽

Yunxia Fu

Keyword(s):

Standard Sphere ◽

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Optimization of a frequency comb-based calibration of a tunable laser

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2574592 ◽

2020 ◽

Author(s):

Ramzil Galiev ◽

Nikita Kondratiev ◽

Valery Lobanov ◽

Igor Bilenko

Keyword(s):

Frequency Comb ◽

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Laser scattering characteristics of common roads

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2575112 ◽

2020 ◽

Author(s):

Yuxiang Jiang ◽

zhenhua li

Keyword(s):

Laser Scattering

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Research of relative spectral responsivity calibration of InGaAs photodetector based on supercontinuum light source

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2573856 ◽

2020 ◽

Author(s):

Yongjie Lin ◽

Nan Xu ◽

Zhiwei Liu ◽

Yingwei He ◽

Wende Liu ◽

...

Keyword(s):

Light Source ◽

Spectral Responsivity ◽

Supercontinuum Light Source

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Design of wireless measurement and control system for interferometer

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2573424 ◽

2020 ◽

Author(s):

Sijing Zhang ◽

Sen Han

Keyword(s):

Control System ◽

Measurement And Control System ◽

Wireless Measurement ◽

And Control ◽

Measurement And Control

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Comparative research on two methods of straight line extraction based on sub-pixel

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2573684 ◽

2020 ◽

Author(s):

Gongqiang Cui ◽

xiaofei wang ◽

Hua Fan

Keyword(s):

Comparative Research ◽

Line Extraction ◽

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Design of multi-wavelength achromatic transmission sphere based on zoom principle

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2573444 ◽

2020 ◽

Author(s):

Yan Wang ◽

Qiyuan Zhang ◽

Qiubai Chen ◽

Shuai Xu ◽

Sen Han

Keyword(s):

Multi Wavelength

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Deep-learning-enabled fringe projection profilometry

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2573579 ◽

2020 ◽

Author(s):

Chao Zuo

Keyword(s):

Deep Learning ◽

Fringe Projection ◽

Fringe Projection Profilometry

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Numerical analysis and simulation optimization design of coplanar waveguide in electro-optic sampling system

Optical Metrology and Inspection for Industrial Applications VII ◽

10.1117/12.2573701 ◽

2020 ◽

Author(s):

Jialin Chen ◽

Liqiang Zhao ◽

Jianwei Li ◽

Chi Chen ◽

Qiming Fan

Keyword(s):

Numerical Analysis ◽

Optimization Design ◽

Simulation Optimization ◽

Coplanar Waveguide ◽

Sampling System ◽

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