Electrical Overstress/Electrostatic Discharge Symposium Proceedings
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Punchthrough transient voltage suppressor for EOS/ESD protection of low-voltage IC's

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478265 ◽

1995 ◽

Author(s):

Bin Yu ◽

Ya-Chin King ◽

J. Pohlman ◽

Chenming Hu

Keyword(s):

Low Voltage ◽

Esd Protection ◽

Transient Voltage

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Carbon loaded device handling trays: analysis and measurements

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478291 ◽

1995 ◽

Author(s):

W.H. Tan

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Sub-micron chip ESD protection schemes which avoid avalanching junctions

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478263 ◽

1995 ◽

Cited By ~ 69

Author(s):

E.R. Worley ◽

R. Gupta ◽

B. Jones ◽

R. Kjar ◽

C. Nguyen ◽

...

Keyword(s):

Esd Protection

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Spacecraft and human electrostatic discharge: a comparison of the two phenomena

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478269 ◽

1995 ◽

Author(s):

K.G. Balmain

Keyword(s):

Electrostatic Discharge

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The correlation between latch-up phenomenon and other failure mechanisms

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478296 ◽

1995 ◽

Cited By ~ 6

Author(s):

M. Mahanpour ◽

I. Morgan

Keyword(s):

Failure Mechanisms ◽

Latch Up

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Calculation and measurement of transient fields from voluminous objects

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478273 ◽

1995 ◽

Cited By ~ 4

Author(s):

R. Zaridze ◽

D. Karkashadze ◽

R.G. Djobava ◽

D. Pommerenke ◽

M. Aidam

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Why does the FDA concern itself with ESD?

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478268 ◽

1995 ◽

Author(s):

E. O'Bryan

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Latent gate oxide defects caused by CDM-ESD

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478299 ◽

1995 ◽

Cited By ~ 16

Author(s):

J.C. Reiner

Keyword(s):

Gate Oxide ◽

Oxide Defects

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ESD improvements for familiar automated handlers

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478275 ◽

1995 ◽

Cited By ~ 6

Author(s):

J. Bernier ◽

B. Hesher

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Advanced CMOS protection device trigger mechanisms during CDM

Electrical Overstress/Electrostatic Discharge Symposium Proceedings ◽

10.1109/eosesd.1995.478281 ◽

1995 ◽

Cited By ~ 23

Author(s):

C. Duvvury ◽

A. Amerasekera

Keyword(s):

Protection Device ◽

Trigger Mechanisms

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Electrical Overstress/Electrostatic Discharge Symposium ProceedingsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Punchthrough transient voltage suppressor for EOS/ESD protection of low-voltage IC's

Carbon loaded device handling trays: analysis and measurements

Sub-micron chip ESD protection schemes which avoid avalanching junctions

Spacecraft and human electrostatic discharge: a comparison of the two phenomena

The correlation between latch-up phenomenon and other failure mechanisms

Calculation and measurement of transient fields from voluminous objects

Why does the FDA concern itself with ESD?

Latent gate oxide defects caused by CDM-ESD

ESD improvements for familiar automated handlers

Advanced CMOS protection device trigger mechanisms during CDM

Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Latest Publications