Proceedings. International Test Conference 1990
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TOTAL DOCUMENTS

139

(FIVE YEARS 0)

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21

(FIVE YEARS 0)

Published By IEEE Comput. Soc. Press

081869064x

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

From specification to measurement: the bottleneck in analog industrial testing

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114016 ◽

2002 ◽

Cited By ~ 1

Author(s):

R.J. van Rijsinge ◽

A.A.R.M. Haggenburg ◽

C. de Vries ◽

H. Wallinga

Keyword(s):

Industrial Testing

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A testable design of logic circuits under highly observable condition

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114116 ◽

2002 ◽

Cited By ~ 5

Author(s):

W. Xiaoqing ◽

K. Kinoshita

Keyword(s):

Logic Circuits ◽

Testable Design

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Design of signature circuits based on weight distributions of error-correcting codes

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114095 ◽

2002 ◽

Cited By ~ 17

Author(s):

K. Iwasaki ◽

N. Yamaguchi

Keyword(s):

Error Correcting Codes ◽

Weight Distributions

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Practical partitioning for testability with time-shared boundary scan

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114118 ◽

2002 ◽

Cited By ~ 3

Author(s):

R.Z. Makki ◽

K. Palaniswami

Keyword(s):

Boundary Scan

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Cellular automata based self-test for programmable data paths

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114094 ◽

2002 ◽

Cited By ~ 4

Author(s):

J. van Sas ◽

F. Catthoor ◽

H. De Man

Keyword(s):

Cellular Automata ◽

Self Test

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Weighted random test program generation for a per-pin tester

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114122 ◽

2002 ◽

Author(s):

J. Gartner ◽

B. Driscoll ◽

D. Forlenza ◽

O. Forlenza ◽

T. Koprowski ◽

...

Keyword(s):

Test Program ◽

Random Test ◽

Program Generation

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Improving wafer sort yields with radius-tip probes

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114109 ◽

2002 ◽

Cited By ~ 2

Author(s):

S. Schleifer

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Bridging faults and their implication to PLAs

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114103 ◽

2002 ◽

Cited By ~ 10

Author(s):

V. Chandramouli ◽

R.K. Gulati ◽

R. Dandapani ◽

D.K. Goel

Keyword(s):

Bridging Faults

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Diagnosis for wiring interconnects

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114069 ◽

2002 ◽

Cited By ~ 57

Author(s):

W.-T. Cheng ◽

J.L. Lewandowski ◽

E. Wu

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An architecture for high-speed analog in-circuit testing

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114068 ◽

2002 ◽

Cited By ~ 1

Author(s):

L. Klein ◽

J. Bridgeman

Keyword(s):

High Speed ◽

Circuit Testing

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