A testable design of logic circuits under highly observable condition
1994 ◽
Vol 29
(6)
◽
pp. 671-678
◽
1993 ◽
Vol 140
(6)
◽
pp. 327-332
1981 ◽
Vol 42
(C4)
◽
pp. C4-423-C4-432
◽
Keyword(s):
2010 ◽
Vol 130
(3)
◽
pp. 227-231
2018 ◽
Vol 1
(2)
◽
pp. 65-76
Keyword(s):