Atomic Force Microscopy - NanoScience and Technology
Latest Publications

TOTAL DOCUMENTS

18

(FIVE YEARS 18)

H-INDEX

1

(FIVE YEARS 1)

Published By Springer International Publishing

9783030136536, 9783030136543

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Harmonic Oscillator

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_2 ◽

2019 ◽

pp. 15-33

Author(s):

Bert Voigtländer

Keyword(s):

Harmonic Oscillator

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Cantilevers and Detection Methods in Atomic Force Microscopy

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_11 ◽

2019 ◽

pp. 177-197

Author(s):

Bert Voigtländer

Keyword(s):

Atomic Force Microscopy ◽

Detection Methods ◽

Force Microscopy ◽

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Lock-in Technique

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_6 ◽

2019 ◽

pp. 119-123

Author(s):

Bert Voigtländer

Keyword(s):

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Mapping of Mechanical Properties Using Force-Distance Curves

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_15 ◽

2019 ◽

pp. 255-259

Author(s):

Bert Voigtländer

Keyword(s):

Mechanical Properties

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Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_13 ◽

2019 ◽

pp. 209-229

Author(s):

Bert Voigtländer

Keyword(s):

Atomic Force Microscopy ◽

Amplitude Modulation ◽

Force Microscopy ◽

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Work Function, Contact Potential, and Kelvin Probe AFM

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_9 ◽

2019 ◽

pp. 149-159 ◽

Author(s):

Bert Voigtländer

Keyword(s):

Work Function ◽

Kelvin Probe ◽

Contact Potential

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Noise in Atomic Force Microscopy

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_17 ◽

2019 ◽

pp. 287-300

Author(s):

Bert Voigtländer

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

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Forces Between Tip and Sample

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_10 ◽

2019 ◽

pp. 161-176

Author(s):

Bert Voigtländer

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Technical Aspects of Atomic Force Microscopy

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_3 ◽

2019 ◽

pp. 35-67

Author(s):

Bert Voigtländer

Keyword(s):

Atomic Force Microscopy ◽

Technical Aspects ◽

Force Microscopy ◽

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Intermittent Contact Mode/Tapping Mode

Atomic Force Microscopy - NanoScience and Technology ◽

10.1007/978-3-030-13654-3_14 ◽

2019 ◽

pp. 231-253

Author(s):

Bert Voigtländer

Keyword(s):

Contact Mode ◽

Tapping Mode ◽

Intermittent Contact

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