Proceedings of International Conference on Microelectronics
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TOTAL DOCUMENTS

159

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Published By IEEE

0780327861

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Production of Sensors for Different Physical Parameters on the Base of All-Pupose and Unified Techno

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500926 ◽

2005 ◽

Cited By ~ 1

Author(s):

V.F. Mitin ◽

Yu.A. Tkhorik

Keyword(s):

Physical Parameters

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Glow-to-arc transition instability sensor in processing plasma

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500935 ◽

2002 ◽

Cited By ~ 3

Author(s):

M. Zlatanovic ◽

B. Tesic ◽

D. Nojkovic

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Physical properties of surface-barrier structure with microrelief semiconductor-metal interface

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500904 ◽

2002 ◽

Author(s):

N.L. Dmitruk

Keyword(s):

Physical Properties ◽

Surface Barrier ◽

Barrier Structure ◽

Metal Interface

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Avalanche phenomena in deeply depleted MOS capacitors

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500942 ◽

2002 ◽

Author(s):

A. Rusu ◽

A.M. Ionescu ◽

A. Chovet

Keyword(s):

Mos Capacitors

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Analog universal active device: theory, design and applications

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500957 ◽

2002 ◽

Author(s):

A. Carlosena ◽

R. Cabeza

Keyword(s):

Active Device

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In-process checking of carrier lifetime distribution in high-power devices

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500900 ◽

2002 ◽

Author(s):

V. Benda

Keyword(s):

High Power ◽

Carrier Lifetime ◽

Lifetime Distribution ◽

Power Devices

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Modeling of coupled silicon beams

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500968 ◽

2002 ◽

Author(s):

M.F. Hribsek ◽

D.V. Tosic

Keyword(s):

Silicon Beams

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Sensor microsystems

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500923 ◽

2002 ◽

Author(s):

R.S. Popovic

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Light absorption and IR photodetectors in P-doped quantum wells

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500903 ◽

2002 ◽

Author(s):

Z. Ikonic ◽

M. Tadic ◽

V. Milanovic

Keyword(s):

Quantum Wells ◽

Light Absorption ◽

Ir Photodetectors

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Fault location in passive analog RC circuits by measuring impulse response

Proceedings of International Conference on Microelectronics ◽

10.1109/icmel.1995.500920 ◽

2002 ◽

Cited By ~ 8

Author(s):

V. Panic ◽

D. Milovanovic ◽

P. Petkovic ◽

V. Litovski

Keyword(s):

Impulse Response ◽

Fault Location

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Proceedings of International Conference on MicroelectronicsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Production of Sensors for Different Physical Parameters on the Base of All-Pupose and Unified Techno

Glow-to-arc transition instability sensor in processing plasma

Physical properties of surface-barrier structure with microrelief semiconductor-metal interface

Avalanche phenomena in deeply depleted MOS capacitors

Analog universal active device: theory, design and applications

In-process checking of carrier lifetime distribution in high-power devices

Modeling of coupled silicon beams

Sensor microsystems

Light absorption and IR photodetectors in P-doped quantum wells

Fault location in passive analog RC circuits by measuring impulse response

Proceedings of International Conference on Microelectronics
Latest Publications