Proceedings of IEEE International Test Conference - (ITC)
Latest Publications

TOTAL DOCUMENTS

131

(FIVE YEARS 0)

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Published By IEEE

0780314301

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Analog circuit testing based on sensitivity computation and new circuit modeling

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470638 ◽

2002 ◽

Cited By ~ 47

Author(s):

N.B. Hamida ◽

B. Kaminska

Keyword(s):

Analog Circuit ◽

Circuit Modeling ◽

Circuit Testing ◽

Analog Circuit Testing

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IEEE P1149.5 to 1149.1 data and protocol conversion

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470658 ◽

2002 ◽

Cited By ~ 6

Author(s):

C. Poirier

Keyword(s):

Protocol Conversion

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BIST for 1149.1-compatible boards: A low-cost and maximum-flexibility solution

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470657 ◽

2002 ◽

Cited By ~ 3

Author(s):

J.M.M. Ferreira ◽

M.G. Gericota ◽

J.L. Ramalho ◽

G.R. Alves

Keyword(s):

Low Cost

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Quality and single-stuck faults

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470645 ◽

2002 ◽

Cited By ~ 18

Author(s):

E.J. McCluskey

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High speed sampling capability for a VLSI mixed signal tester

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470608 ◽

2002 ◽

Cited By ~ 1

Author(s):

P. Sakamoto ◽

T. Chiu

Keyword(s):

High Speed ◽

Mixed Signal ◽

High Speed Sampling

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IRIDIUM satellite: A large system application of design for testability

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470673 ◽

2002 ◽

Cited By ~ 11

Author(s):

C. Champlin

Keyword(s):

System Application ◽

Design For Testability ◽

Large System

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MixTest: A mixed-signal extension to a digital test system

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470605 ◽

2002 ◽

Cited By ~ 8

Author(s):

R. Mehtani ◽

B. Atzema ◽

M. De Jonghe ◽

R. Morren ◽

G. Seuren ◽

...

Keyword(s):

Test System ◽

Mixed Signal ◽

Digital Test

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Utilizing boundary scan to implement BIST

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470705 ◽

2002 ◽

Cited By ~ 3

Author(s):

T. Langford

Keyword(s):

Boundary Scan

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Technology-independent boundary scan synthesis (technology and physical issues)

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470706 ◽

2002 ◽

Cited By ~ 3

Author(s):

M.F. Robinson ◽

F. Mailhot ◽

J. Konsevich

Keyword(s):

Boundary Scan

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Automated testing of open software standards

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470616 ◽

2002 ◽

Cited By ~ 1

Author(s):

J.F. Leathrum ◽

K.A. Liburdy

Keyword(s):

Automated Testing ◽

Software Standards

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Proceedings of IEEE International Test Conference - (ITC)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Analog circuit testing based on sensitivity computation and new circuit modeling

IEEE P1149.5 to 1149.1 data and protocol conversion

BIST for 1149.1-compatible boards: A low-cost and maximum-flexibility solution

Quality and single-stuck faults

High speed sampling capability for a VLSI mixed signal tester

IRIDIUM satellite: A large system application of design for testability

MixTest: A mixed-signal extension to a digital test system

Utilizing boundary scan to implement BIST

Technology-independent boundary scan synthesis (technology and physical issues)

Automated testing of open software standards

Proceedings of IEEE International Test Conference - (ITC)
Latest Publications