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Proceedings of IEEE International Test Conference - (ITC)
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TOTAL DOCUMENTS
131
(FIVE YEARS 0)
H-INDEX
22
(FIVE YEARS 0)
Published By IEEE
0780314301
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Latest Documents
Most Cited Documents
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IEEE P1149.5 to 1149.1 data and protocol conversion
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470658
◽
2002
◽
Cited By ~ 6
Author(s):
C. Poirier
Keyword(s):
Protocol Conversion
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Analog circuit testing based on sensitivity computation and new circuit modeling
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470638
◽
2002
◽
Cited By ~ 47
Author(s):
N.B. Hamida
◽
B. Kaminska
Keyword(s):
Analog Circuit
◽
Circuit Modeling
◽
Circuit Testing
◽
Analog Circuit Testing
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MixTest: A mixed-signal extension to a digital test system
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470605
◽
2002
◽
Cited By ~ 8
Author(s):
R. Mehtani
◽
B. Atzema
◽
M. De Jonghe
◽
R. Morren
◽
G. Seuren
◽
...
Keyword(s):
Test System
◽
Mixed Signal
◽
Digital Test
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BIST for 1149.1-compatible boards: A low-cost and maximum-flexibility solution
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470657
◽
2002
◽
Cited By ~ 3
Author(s):
J.M.M. Ferreira
◽
M.G. Gericota
◽
J.L. Ramalho
◽
G.R. Alves
Keyword(s):
Low Cost
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Quality and single-stuck faults
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470645
◽
2002
◽
Cited By ~ 18
Author(s):
E.J. McCluskey
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High speed sampling capability for a VLSI mixed signal tester
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470608
◽
2002
◽
Cited By ~ 1
Author(s):
P. Sakamoto
◽
T. Chiu
Keyword(s):
High Speed
◽
Mixed Signal
◽
High Speed Sampling
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IRIDIUM satellite: A large system application of design for testability
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470673
◽
2002
◽
Cited By ~ 11
Author(s):
C. Champlin
Keyword(s):
System Application
◽
Design For Testability
◽
Large System
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Utilizing boundary scan to implement BIST
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470705
◽
2002
◽
Cited By ~ 3
Author(s):
T. Langford
Keyword(s):
Boundary Scan
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Technology-independent boundary scan synthesis (technology and physical issues)
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470706
◽
2002
◽
Cited By ~ 3
Author(s):
M.F. Robinson
◽
F. Mailhot
◽
J. Konsevich
Keyword(s):
Boundary Scan
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Automated testing of open software standards
Proceedings of IEEE International Test Conference - (ITC)
◽
10.1109/test.1993.470616
◽
2002
◽
Cited By ~ 1
Author(s):
J.F. Leathrum
◽
K.A. Liburdy
Keyword(s):
Automated Testing
◽
Software Standards
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