Advances in Metrology for X-Ray and EUV Optics VII
Latest Publications

TOTAL DOCUMENTS

20
(FIVE YEARS 0)

H-INDEX

2
(FIVE YEARS 0)

Published By SPIE

9781510612273, 9781510612280
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Status of the metrology laboratory for the LCLS II project (Conference Presentation)

2017 ◽  
Author(s):  
May Ling Ng ◽  
Corey L. Hardin ◽  
Josep Nicolas ◽  
Daniele Cocco

X-ray optics laboratory at the ALS: current capabilities, new challenges, and tasks for further development (Conference Presentation)

2017 ◽  
Author(s):  
Ian Lacey ◽  
Gary P. Centers ◽  
Gevork S. Gevorkyan ◽  
Sergey M. Nikitin ◽  
Brian V. Smith ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
New Challenges ◽  
Further Development

Development of relative angle determinable stitching interferometry for high-accuracy x-ray focusing mirrors

2017 ◽  
Author(s):  
Zhanshan Wang ◽  
Yingna Shi ◽  
Qiushi Huang ◽  
Hua Wang ◽  
Aiguo Li ◽  
...  
Keyword(s):  
High Accuracy ◽  
X Ray ◽  
Relative Angle

Metrology of variable-line-spacing x-ray gratings using the APS Long Trace Profiler

2017 ◽  
Author(s):  
Jun Qian ◽  
Jonathan Manton ◽  
Sunil Bean ◽  
Peter Takacs ◽  
Lahsen Assoufid ◽  
...  
Keyword(s):  
X Ray ◽  
Variable Line ◽  
Line Spacing

New twist in the optical schematic of surface slope measuring long trace profiler

2017 ◽  
Author(s):  
Gevork S. Gevorkyan ◽  
Wayne R. McKinney ◽  
Ian Lacey ◽  
Sergey M. Nikitin ◽  
Valeriy V. Yashchuk ◽  
...  
Keyword(s):  
Surface Slope ◽  
Optical Schematic

Single-grating Talbot imaging for wavefront sensing and x-ray metrology

2017 ◽  
Author(s):  
Walan C. Grizolli ◽  
Xianbo Shi ◽  
Lahsen Assoufid ◽  
Tomasz Kolodziej ◽  
Yuri Shvyd’ko
Keyword(s):  
Wavefront Sensing ◽  
X Ray

scholarly journals Intrinsic resolving power of XUV diffraction gratings measured with Fizeau interferometry

2017 ◽  
Author(s):  
Jonathan Manton ◽  
Samuel Gleason ◽  
Janet Sheung ◽  
Taylor Byrum ◽  
Cody Jensen ◽  
...  
Keyword(s):  
Diffraction Gratings ◽  
Resolving Power

X-ray multilayer mid-frequency characterizations using speckle scanning techniques

2017 ◽  
Author(s):  
Hui Jiang ◽  
SHUAI YAN ◽  
DONGXU LIANG ◽  
NAXI TIAN ◽  
HUA WANG ◽  
...  
Keyword(s):  
X Ray
Load More ...
Sign in / Sign up

Export Citation Format

Share Document