Bismuth silicate micro-crystals with grain array structure were prepared by
sintering method under atmosphere pressure. The samples were characterized
for structural and surface morphological properties by X-ray diffraction
(XRD) and Environmental scanning electron microscopy (ESEM). The result
shows that stable grain arrays grow by iterative mode. If a stable grain
array eliminates, a new stable grain array will generate. In a stable parent
array, an offspring array may generate after the corresponding partial
elimination of its parent array. If one part of an offspring array stops
growing, it will be as a new parent array, and then its offspring grain
array will create. The sum of the lengths of an offspring array and the
corresponding eliminated part of its parent array is equal to the length of
the next eliminated part of its parent array. It means the growth rate of an
offspring array is equal to that of the corresponding survived part of its
parent array. There is a highly correlation between grain array length and
average grain line spacing. It means that larger average grain line spacing
corresponds to the stable grain array with lager length. When average grain
line spacing increases 1?m, the corresponding array length will increase
approximately 7.6?m.
X-ray spectroscopy with variable line spacing based on reflection zone plate optics