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Microscopy of Semiconducting Materials
Latest Publications
TOTAL DOCUMENTS
11
(FIVE YEARS 0)
H-INDEX
0
(FIVE YEARS 0)
Published By CRC Press
9780429176135
Latest Documents
Most Cited Documents
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Dislocations and boundaries
Microscopy of Semiconducting Materials
◽
10.1201/9781482268690-7
◽
2000
◽
pp. 69-114
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High resolution microscopy and microanalysis
Microscopy of Semiconducting Materials
◽
10.1201/9781482268690-6
◽
2000
◽
pp. 19-68
Keyword(s):
High Resolution
◽
High Resolution Microscopy
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Metallization, siIicides and contacts
Microscopy of Semiconducting Materials
◽
10.1201/9781482268690-13
◽
2000
◽
pp. 555-592
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Epitaxy: growth phenomena
Microscopy of Semiconducting Materials
◽
10.1201/9781482268690-9
◽
2000
◽
pp. 179-276
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Device studies and specimen preparation
Microscopy of Semiconducting Materials
◽
10.1201/9781482268690-14
◽
2000
◽
pp. 593-632
Keyword(s):
Specimen Preparation
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Epitaxy: defect formation
Microscopy of Semiconducting Materials
◽
10.1201/9781482268690-10
◽
2000
◽
pp. 277-352
Keyword(s):
Defect Formation
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Self-organized and quantum domain structures
Microscopy of Semiconducting Materials
◽
10.1201/9781482268690-8
◽
2000
◽
pp. 115-178
Keyword(s):
Domain Structures
◽
Self Organized
◽
Quantum Domain
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Advanced scanning electron and optical microscopy
Microscopy of Semiconducting Materials
◽
10.1201/9781482268690-16
◽
2000
◽
pp. 663-756
Keyword(s):
Optical Microscopy
◽
Scanning Electron
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Processed silicon and related materials
Microscopy of Semiconducting Materials
◽
10.1201/9781482268690-12
◽
2000
◽
pp. 447-554
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Epitaxy: wide band-gap nitrides
Microscopy of Semiconducting Materials
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10.1201/9781482268690-11
◽
2000
◽
pp. 353-446
Keyword(s):
Band Gap
◽
Wide Band
◽
Wide Band Gap
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