2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Latest Publications

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Published By IEEE

9781509015078

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On the influence of compiler optimizations in the fault tolerance of embedded systems

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604701 ◽

2016 ◽

Cited By ~ 3

Author(s):

Alejandro Serrano-Cases ◽

Jose Isaza-Gonzalez ◽

Sergio Cuenca-Asensi ◽

Antonio Martinez-Alvarez

Keyword(s):

Fault Tolerance ◽

Embedded Systems ◽

Compiler Optimizations

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Power-side-channel analysis of carbon nanotube FET based design

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604705 ◽

2016 ◽

Cited By ~ 1

Author(s):

Chandra K. H. Suresh ◽

Bodhisatwa Mazumdar ◽

Sk Subidh Ali ◽

Ozgur Sinanoglu

Keyword(s):

Carbon Nanotube ◽

Side Channel ◽

Side Channel Analysis ◽

Channel Analysis ◽

Carbon Nanotube Fet

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Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604683 ◽

2016 ◽

Cited By ~ 1

Author(s):

Konstantin Tscherkaschin ◽

Theodor Hillebrand ◽

Maike Taddiken ◽

Steffen Paul ◽

Dagmar Peters-Drolshagen

Keyword(s):

Digital Circuit ◽

Cmos Process ◽

Digital Circuit Designs

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Susceptible workload driven selective fault tolerance using a probabilistic fault model

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604682 ◽

2016 ◽

Cited By ~ 4

Author(s):

Mauricio D. Gutierrez ◽

Vasileios Tenentes ◽

Tom J. Kazmierski

Keyword(s):

Fault Tolerance ◽

Fault Model

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Feasibility of software-based repair for program memories

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604699 ◽

2016 ◽

Cited By ~ 2

Author(s):

Patryk Skoncej ◽

Felix Muhlbauer ◽

Felix Kubicek ◽

Lukas Schroder ◽

Mario Scholzel

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Conditional soft-edge flip-flop for SET mitigation

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604708 ◽

2016 ◽

Author(s):

Panagiotis Sismanoglou ◽

Dimitris Nikolos

Keyword(s):

Flip Flop ◽

Soft Edge

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Statistical analysis and comparison of 2T and 3T1D e-DRAM minimum energy operation

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604667 ◽

2016 ◽

Cited By ~ 1

Author(s):

Manish Rana ◽

Ramon Canal ◽

Esteve Amat ◽

Antonio Rubio

Keyword(s):

Statistical Analysis ◽

Minimum Energy

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SET response of a SEL protection switch for 130 and 250 nm CMOS technologies

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604695 ◽

2016 ◽

Cited By ~ 3

Author(s):

Marko Andjelkovic ◽

Aleksandar Ilic ◽

Vladimir Petrovic ◽

Miljana Nenadovic ◽

Zoran Stamenkovic ◽

...

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Single-event performance of differential flip-flop designs and hardening implication

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604707 ◽

2016 ◽

Author(s):

R. M. Chen ◽

E. X. Zhang ◽

B. L. Bhuva

Keyword(s):

Single Event ◽

Flip Flop

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An odd-even scheme to prevent a packet from being corrupted and dropped in fault tolerant NoCs

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2016.7604698 ◽

2016 ◽

Cited By ~ 5

Author(s):

Biswajit Bhowmik ◽

Santosh Biswas ◽

Jatindra Kumar Deka

Keyword(s):

Fault Tolerant

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2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

On the influence of compiler optimizations in the fault tolerance of embedded systems

Power-side-channel analysis of carbon nanotube FET based design

Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process

Susceptible workload driven selective fault tolerance using a probabilistic fault model

Feasibility of software-based repair for program memories

Conditional soft-edge flip-flop for SET mitigation

Statistical analysis and comparison of 2T and 3T1D e-DRAM minimum energy operation

SET response of a SEL protection switch for 130 and 250 nm CMOS technologies

Single-event performance of differential flip-flop designs and hardening implication

An odd-even scheme to prevent a packet from being corrupted and dropped in fault tolerant NoCs

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Latest Publications