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2015 86th ARFTG Microwave Measurement Conference
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TOTAL DOCUMENTS
26
(FIVE YEARS 0)
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4
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Published By IEEE
9781467392471
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Executive committee
2015 86th ARFTG Microwave Measurement Conference
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10.1109/arftg.2015.7381456
◽
2015
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Keyword(s):
Executive Committee
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Joint self-heating and RF large signal characterization
2015 86th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2015.7381479
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2015
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Author(s):
Francisco J. Martinez-Rodriguez
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Patrick Roblin
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Jose I. Martinez-Lopez
Keyword(s):
Large Signal
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Self Heating
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Signal Characterization
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Sensor-on-CMOS dielectric characterization using temperature modulation
2015 86th ARFTG Microwave Measurement Conference
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10.1109/arftg.2015.7381458
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2015
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Cited By ~ 1
Author(s):
Jun-Chau Chien
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Ali M. Niknejad
Keyword(s):
Temperature Modulation
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Dielectric Characterization
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Microwave characterization of ink-jet printed CPW on PET substrates
2015 86th ARFTG Microwave Measurement Conference
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10.1109/arftg.2015.7381461
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2015
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Cited By ~ 3
Author(s):
A. Sahu
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V. Devabhaktuni
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A. Lewandowski
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P. Barmuta
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T. M. Wallis
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...
Keyword(s):
Microwave Characterization
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Ink Jet
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Towards faster, swept, time-coherent transient network analyzer measurements
2015 86th ARFTG Microwave Measurement Conference
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10.1109/arftg.2015.7381466
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2015
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Cited By ~ 2
Author(s):
J. Martens
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E. Vayner
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J. Tu
Keyword(s):
Network Analyzer
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Transient Network
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An IQ-steering technique for amplitude and phase control of mm-wave signals
2015 86th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2015.7381471
◽
2015
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Cited By ~ 3
Author(s):
Akshay Visweswaran
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Carmine de Martino
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Emilio Sirignano
◽
Marco Spirito
Keyword(s):
Phase Control
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Hurdles to on-wafer harmonic measurements
2015 86th ARFTG Microwave Measurement Conference
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10.1109/arftg.2015.7381467
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2015
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Cited By ~ 1
Author(s):
Kathleen Muhonen
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A compact measurement set-up for envelope-tracking RF PAs with calibrated sensing of baseband V/I at the supply terminal
2015 86th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2015.7381468
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2015
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Cited By ~ 3
Author(s):
Julien Couvidat
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Gian Piero Gibiino
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Guillaume Pailloncy
◽
Marc Vanden Bossche
◽
Anthony Ghiotto
◽
...
Keyword(s):
Envelope Tracking
◽
Set Up
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The impact of knowing the impedance of the lines used in the TRL calibration on the load-pull characterization of power transistors
2015 86th ARFTG Microwave Measurement Conference
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10.1109/arftg.2015.7381472
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2015
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Cited By ~ 2
Author(s):
M. A Pulido-Gaytan
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J. A. Reynoso-Hernandez
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M. C. Maya-Sanchez
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J. R. Loo-Yau
Keyword(s):
Power Transistors
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The Impact
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Load Pull
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Uncertainty analysis in coplanar waveguide with unscented transformation
2015 86th ARFTG Microwave Measurement Conference
◽
10.1109/arftg.2015.7381476
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2015
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Cited By ~ 3
Author(s):
Aleksandr A. Savin
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Vladimir G. Guba
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Olesia N. Bykova
Keyword(s):
Uncertainty Analysis
◽
Coplanar Waveguide
◽
Unscented Transformation
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