A built-in self-test approach for medium to high-resolution digital-to-analog converters

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367203 ◽

2002 ◽

Author(s):

K. Arabi ◽

B. Kaminska ◽

J. Rzeszut

Keyword(s):

High Resolution ◽

Digital To Analog Converters ◽

Self Test ◽

Built In Self Test ◽

Digital To Analog

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An embedded built-in-self-test approach for digital-to-analog converters

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990320 ◽

2002 ◽

Author(s):

T. Jeng-Horng ◽

Ming-Jun Hsiao ◽

Tsin-Yuan Chang

Keyword(s):

Digital To Analog Converters ◽

Self Test ◽

Built In Self Test ◽

Digital To Analog

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A built-in-self-test scheme for digital to analog converters

17th International Conference on VLSI Design. Proceedings. ◽

10.1109/icvd.2004.1261065 ◽

2004 ◽

Author(s):

K.P. Sunil Rafeeque ◽

V. Vasudevan

Keyword(s):

Test Scheme ◽

Digital To Analog Converters ◽

Self Test ◽

Built In Self Test ◽

Digital To Analog

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Thermometric decoders for high resolution digital-to-analog converters

2016 IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference (EIConRusNW) ◽

10.1109/eiconrusnw.2016.7448199 ◽

2016 ◽

Author(s):

M. S. Yenuchenko

Keyword(s):

High Resolution ◽

Digital To Analog Converters ◽

Digital To Analog

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A New Built-in Self-test Approach For Digital-to-analog And Analog-to-digital Converters

IEEE/ACM International Conference on Computer-Aided Design ◽

10.1109/iccad.1994.629860 ◽

2005 ◽

Author(s):

K. Arabi ◽

B. Kaminska ◽

J. Rzeszut

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital ◽

Self Test ◽

Built In Self Test ◽

Digital To Analog

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High-resolution mismatch-shaping digital-to-analog converters

ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems (Cat. No.01CH37196) ◽

10.1109/iscas.2001.921906 ◽

2002 ◽

Author(s):

J. Steensgaard

Keyword(s):

High Resolution ◽

Digital To Analog Converters ◽

Digital To Analog ◽

Mismatch Shaping

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A 10 Gsps 8 bit digital-to-analog converter with a built-in self-test circuit

Journal of Semiconductors ◽

10.1088/1674-4926/34/12/125007 ◽

2013 ◽

Vol 34 (12) ◽

pp. 125007

Author(s):

Lei Zhou ◽

Danyu Wu ◽

Fan Jiang ◽

Zhi Jin ◽

Xinyu Liu

Keyword(s):

Digital To Analog Converter ◽

Test Circuit ◽

Analog Converter ◽

Self Test ◽

Built In Self Test ◽

Digital To Analog

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A Foreground Self-calibration Technique for High-Resolution Switched-Current R-2R Digital-to-Analog Converters

Circuits Systems and Signal Processing ◽

10.1007/s00034-019-01284-x ◽

2019 ◽

Vol 39 (5) ◽

pp. 2307-2327

Author(s):

Arash Esmaili ◽

Hadiseh Babazadeh

Keyword(s):

High Resolution ◽

Calibration Technique ◽

Digital To Analog Converters ◽

Self Calibration ◽

Switched Current ◽

Digital To Analog

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An Automated Test Set for High Resolution Analog-to-Digital and Digital-to-Analog Converters

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.1979.4314824 ◽

1979 ◽

Vol 28 (4) ◽

pp. 239-244 ◽

Author(s):

T. Michael Souders ◽

Donald R. Flach

Keyword(s):

High Resolution ◽

Test Set ◽

Analog To Digital ◽

Digital To Analog Converters ◽

Automated Test ◽

Digital To Analog

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An Area-Efficient High-Resolution Segmented Σ Δ -DAC for Built-In Self-Test Applications

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2021.3106014 ◽

2021 ◽

pp. 1-14

Author(s):

Ahmed S. Emara ◽

Denis Romanov ◽

Gordon W. Roberts ◽

Sadok Aouini ◽

Soheyl Ziabakhsh ◽

...

Keyword(s):

High Resolution ◽

Self Test ◽

Built In Self Test ◽

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High-speed high-resolution low-power self-calibrated digital-to-analog converters

10.31274/rtd-180813-10990 ◽

2001 ◽

Author(s):

Weibiao Zhang

Keyword(s):

High Resolution ◽

Low Power ◽

Digital To Analog Converters ◽

Digital To Analog

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