Advances in X-Ray Analysis
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40

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H-INDEX

6

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Published By Springer US

9781468475371, 9781468475357

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A Dynamical Theory Approach to the Berg-Barrett Technique

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_9 ◽

1969 ◽

pp. 139-150 ◽

Cited By ~ 4

Author(s):

B. Roessler ◽

R. W. Armstrong

Keyword(s):

Dynamical Theory ◽

Theory Approach

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Solid Solutions of Cadmium Sulfide-Cadium Selenide Films: Preparation and Determination by X-Ray Flourescence Method

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_38 ◽

1969 ◽

pp. 581-600 ◽

Cited By ~ 2

Author(s):

Frank L. Chan ◽

James T. Carpenter

Keyword(s):

Cadmium Sulfide ◽

Solid Solutions ◽

X Ray

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A Total Reflection X-Ray Spectrograph for Fluorescent Analysis of Light Elements

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_32 ◽

1969 ◽

pp. 496-505

Author(s):

R. D. Davies ◽

H. K. Herglotz

Keyword(s):

Total Reflection ◽

Light Elements ◽

X Ray ◽

Fluorescent Analysis

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Some Recent Work in Low Energy X-Ray and Electron Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_31 ◽

1969 ◽

pp. 480-495 ◽

Cited By ~ 5

Author(s):

Burton L. Henke ◽

Robert E. Lent

Keyword(s):

Recent Work ◽

Low Energy ◽

X Ray

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Measurement of Thin Oxide Surface Film Thicknesses and Atomic Densities by the Analysis of Positive Ion Excited Soft X-Ray Spectra

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_30 ◽

1969 ◽

pp. 457-479

Author(s):

W. P. Saylor ◽

C. L. Marks

Keyword(s):

Surface Film ◽

Oxide Surface ◽

X Ray ◽

Thin Oxide ◽

Positive Ion

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Direct Printout X-Ray Pole Figures from Digital Computers

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_25 ◽

1969 ◽

pp. 391-403 ◽

Cited By ~ 2

Author(s):

Hung-Chi Chao

Keyword(s):

X Ray ◽

Pole Figures ◽

Digital Computers

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Precise Cell Parameters of Semiconductor Crystals and Their Applications

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_22 ◽

1969 ◽

pp. 343-353 ◽

Cited By ~ 2

Author(s):

E. D. Pierron ◽

J. B. McNeely

Keyword(s):

Cell Parameters ◽

Semiconductor Crystals

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X-Ray Analysis of Fatigue Softening in Cold Worked Copper

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_15 ◽

1969 ◽

pp. 236-248 ◽

Cited By ~ 2

Author(s):

Roy G. Baggerly ◽

Regis M. N. Pelloux

Keyword(s):

X Ray ◽

Cold Worked

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Diffraction Analysis of Liquid and Amorphous Alloys

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_3 ◽

1969 ◽

pp. 50-71 ◽

Cited By ~ 5

Author(s):

C. N. J. Wagner

Keyword(s):

Diffraction Analysis ◽

Amorphous Alloys

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Proton Scattering from Single Crystals

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7535-7_4 ◽

1969 ◽

pp. 72-86 ◽

Cited By ~ 2

Author(s):

Charles S. Barrett

Keyword(s):

Single Crystals ◽

Proton Scattering

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