X-Ray Spectrometry in Electron Beam Instruments
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18

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4

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Published By Springer US

9781461357384, 9781461518259

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Quantifying Benefits of Resolution and Count Rate in EDX Microanalysis

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_8 ◽

1995 ◽

pp. 101-126 ◽

Author(s):

P. J. Statham

Keyword(s):

Edx Microanalysis

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The Effect of Detector Dead Layers on Light Element Detection

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_6 ◽

1995 ◽

pp. 67-81 ◽

Author(s):

J. J. McCarthy

Keyword(s):

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Application of Layered Synthetic Microstructure Crystals to WDX Microanalysis of Ultra-light Elements

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_17 ◽

1995 ◽

pp. 287-303 ◽

Author(s):

R. Rybka ◽

R. C. Wolf

Keyword(s):

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A von Hamos-Type Parallel Collection Wavelength Dispersive Spectrometer for Microbeam Analysis

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_15 ◽

1995 ◽

pp. 259-273

Author(s):

A. M. Panin ◽

M. W. Lund

Keyword(s):

Microbeam Analysis ◽

Wavelength Dispersive Spectrometer

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Synthetic Multilayer Crystals for EPMA of Ultra-light Elements

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_14 ◽

1995 ◽

pp. 239-257 ◽

Author(s):

G. F. Bastin ◽

H. J. M. Heijligers

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A Study of Systematic Errors in Multiple Linear Regression Peak Fitting Using Generated Spectra

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_10 ◽

1995 ◽

pp. 159-166 ◽

Author(s):

C. R. Swyt

Keyword(s):

Linear Regression ◽

Multiple Linear Regression ◽

Systematic Errors ◽

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Modeling the Energy Dispersive X-Ray Detector

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_5 ◽

1995 ◽

pp. 53-65 ◽

Author(s):

D. C. Joy

Keyword(s):

Energy Dispersive ◽

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Current Trends in Si(Li) Detector Windows for Light Element Analysis

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_3 ◽

1995 ◽

pp. 21-31 ◽

Author(s):

M. W. Lund

Keyword(s):

Light Element ◽

Element Analysis ◽

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An Evaluation of Quantitative Electron Probe Methods

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_18 ◽

1995 ◽

pp. 305-367 ◽

Author(s):

K. F. J. Heinrich

Keyword(s):

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Fitting Wavelength Dispersive Spectra with the NIST/NIH DTSA Program

X-Ray Spectrometry in Electron Beam Instruments ◽

10.1007/978-1-4615-1825-9_16 ◽

1995 ◽

pp. 275-285 ◽

Author(s):

R. L. Myklebust

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